COMPUTER-ANALYSIS OF PUNCH-THROUGH IN MOSFETS

被引:25
作者
KOTANI, N
KAWAZU, S
机构
[1] LSI Development Laboratory, Mitsubishi Electric Corporation, Itami, Hyogo, 4-1, Mizuhara
关键词
D O I
10.1016/0038-1101(79)90172-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A two-dimensional numerical analysis is made for MOSFETs having short channel lengths. The short channel MOSFET is especially characterized by the existence of the punch-through current which cannot be explained by the one-dimensional MOSFET models. The two-dimensional analysis makes clear the following facts relating about the punch-through mechanism. The punch-through is a condition in which the depletion layers of the source and the drain connect mutually at the deep region in the substrate even in equilibrium. The punch-through current is injected through the saddle point of the intrinsic potential into the drain region by the electric field from the drain, at the low gate voltages. © 1979.
引用
收藏
页码:63 / +
页数:1
相关论文
共 17 条
[1]   DISTRIBUTION OF MOBILE CARRIERS IN PINCH-OFF REGION OF AN INSULATED-GATE FIELD-EFFECT TRANSISTOR AND ITS INFLUENCE ON DEVICE BREAKDOWN [J].
ARMSTRONG, GA ;
MAGOWAN, JA .
SOLID-STATE ELECTRONICS, 1971, 14 (08) :723-+
[2]   FINITE-ELEMENT SIMULATION OF GAAS MESFETS WITH LATERAL DOPING PROFILES AND SUBMICRON GATES [J].
BARNES, JJ ;
LOMAX, RJ ;
HADDAD, GI .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (09) :1042-1048
[3]  
BARRON MB, 1969, 55011 STANF EL LAB R
[4]   DRAIN VOLTAGE LIMITATIONS OF MOS-TRANSISTORS [J].
BATEMAN, IM ;
ARMSTRONG, GA ;
MAGOWAN, JA .
SOLID-STATE ELECTRONICS, 1974, 17 (06) :539-550
[5]   COMPUTER-SIMULATION OF TRANSFERRED ELECTRON DEVICES USING DISPLACED MAXWELLIAN APPROACH [J].
BOSCH, R ;
THIM, HW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (01) :16-25
[6]   THRESHOLD VOLTAGE FROM NUMERICAL SOLUTION OF 2-DIMENSIONAL MOS-TRANSISTOR [J].
DELAMONEDA, FH .
IEEE TRANSACTIONS ON CIRCUIT THEORY, 1973, CT20 (06) :666-673
[8]   SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR [J].
HOFSTEIN, SR ;
HEIMAN, FP .
PROCEEDINGS OF THE IEEE, 1963, 51 (09) :1190-&
[9]   CURRENT SATURATION AND SMALL-SIGNAL CHARACTERISTICS OF GAAS FIELD-EFFECT TRANSISTORS [J].
HOWER, PL ;
BECHTEL, NG .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (03) :213-220
[10]   ANALYSIS OF THRESHOLD VOLTAGE FOR SHORT-CHANNEL IGFETS [J].
LEE, HS .
SOLID-STATE ELECTRONICS, 1973, 16 (12) :1407-1417