XPS STUDY OF SIO THIN-FILMS AND SIO METAL INTERFACES

被引：88

作者：

NGUYEN, TP

LEFRANT, S

机构：

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1989年 / 1卷 / 31期

关键词：

D O I：

10.1088/0953-8984/1/31/019

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：5197 / 5204

页数：8

共 28 条

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