ELECTRICALLY ACTIVE POINT-DEFECTS IN AMORPHOUS-SILICON NITRIDE - AN ILLUMINATION AND CHARGE INJECTION STUDY

被引:156
作者
KRICK, DT [1 ]
LENAHAN, PM [1 ]
KANICKI, J [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1063/1.341499
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:3558 / 3563
页数:6
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