DOPING AND DIFFUSION BEHAVIOR OF FE IN MOVPE GROWN INP LAYERS

被引:7
作者
FRANKE, D
HARDE, P
WOLFRAM, P
GROTE, N
机构
[1] Heinrich-Hertz-Institut für Nachrichtentechnik Berlin GmbH, D-1000 Berlin 10
关键词
D O I
10.1016/0022-0248(90)90230-I
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Doping and diffusion characteristics of Fe in semi-insulating AP-MOVPE grown InP layers were assumed using the SIMS technique. Fairly flat Fe depth profiles and a linear doping curve were obtained at concentrations of up to the lower range of 1017 cm-3. Accumulation of Fe at the substrate/layer interface was found on quite a few samples indicating a gettering effect of the substrate. Very little, if not negligible, diffusion was observed on alternately Fe-doped/undoped structures even after high-temperature heat treatment as long as the Fe content was in the midrange of 1016 cm-3, or lower. © 1990.
引用
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页码:309 / 312
页数:4
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