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COMPARISON OF EXPERIMENTAL AND COMPUTED RESULTS ON ARSENIC-DOPED AND PHOSPHORUS-DOPED POLYSILICON EMITTER BIPOLAR-TRANSISTORS
被引:31
作者
:
ASHBURN, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ASHBURN, P
[
1
]
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
ROULSTON, DJ
[
1
]
SELVAKUMAR, CR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
SELVAKUMAR, CR
[
1
]
机构
:
[1]
UNIV WATERLOO,DEPT ELECT ENGN,WATERLOO N2L 3G1,ONTARIO,CANADA
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1987年
/ 34卷
/ 06期
关键词
:
D O I
:
10.1109/T-ED.1987.23090
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1346 / 1353
页数:8
相关论文
共 24 条
[11]
MEASUREMENT OF THE MINORITY-CARRIER TRANSPORT PARAMETERS IN HEAVILY DOPED SILICON
[J].
MERTENS, RP
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0
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0
h-index:
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MERTENS, RP
;
VANMEERBERGEN, JL
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0
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VANMEERBERGEN, JL
;
NIJS, JF
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0
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NIJS, JF
;
VANOVERSTRAETEN, RJ
论文数:
0
引用数:
0
h-index:
0
VANOVERSTRAETEN, RJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(05)
:949
-955
[12]
EXPERIMENTAL-STUDY OF THE MINORITY-CARRIER TRANSPORT AT THE POLYSILICON MONOSILICON INTERFACE
[J].
NEUGROSCHEL, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
NEUGROSCHEL, A
;
ARIENZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ARIENZO, M
;
KOMEM, Y
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KOMEM, Y
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ISAAC, RD
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0
引用数:
0
h-index:
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IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ISAAC, RD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(04)
:807
-816
[13]
METHOD FOR DETERMINING THE EMITTER AND BASE SERIES RESISTANCES OF BIPOLAR-TRANSISTORS
[J].
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
;
TANG, DD
论文数:
0
引用数:
0
h-index:
0
TANG, DD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(04)
:409
-412
[14]
EFFECT OF EMITTER CONTACT ON CURRENT GAIN OF SILICON BIPOLAR-DEVICES
[J].
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
;
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
ISAAC, RD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(11)
:2051
-2055
[15]
CHARACTERIZATION OF NON-OHMIC BEHAVIOR OF EMITTER CONTACTS OF BIPOLAR-TRANSISTORS
[J].
RICCO, B
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
RICCO, B
;
STORK, JMC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
STORK, JMC
;
ARIENZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ARIENZO, M
.
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(07)
:221
-223
[16]
SIMPLIFIED COMPUTER-AIDED ANALYSIS OF DOUBLE-DIFFUSED TRANSISTORS INCLUDING 2-DIMENSIONAL HIGH-LEVEL EFFECTS
[J].
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
;
SEHGAL, J
论文数:
0
引用数:
0
h-index:
0
SEHGAL, J
;
CHAMBERL.SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERL.SG
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(06)
:809
-&
[17]
MODELING AND MEASUREMENT OF MINORITY-CARRIER LIFETIME VERSUS DOPING IN DIFFUSED LAYERS OF N+-P SILICON DIODES
[J].
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
;
ARORA, ND
论文数:
0
引用数:
0
h-index:
0
ARORA, ND
;
CHAMBERLAIN, SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERLAIN, SG
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(02)
:284
-291
[18]
MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS
[J].
SLOTBOOM, JW
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
SLOTBOOM, JW
;
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
DEGRAAFF, HC
.
SOLID-STATE ELECTRONICS,
1976,
19
(10)
:857
-862
[19]
SOEOWIRDJO B, 1983, SOLID STATE ELECTRON, V26, P495
[20]
HIGH-GAIN BIPOLAR-TRANSISTORS WITH POLYSILICON TUNNEL JUNCTION EMITTER CONTACTS
[J].
VANHALEN, P
论文数:
0
引用数:
0
h-index:
0
VANHALEN, P
;
PULFREY, DL
论文数:
0
引用数:
0
h-index:
0
PULFREY, DL
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(07)
:1307
-1313
←
1
2
3
→
共 24 条
[11]
MEASUREMENT OF THE MINORITY-CARRIER TRANSPORT PARAMETERS IN HEAVILY DOPED SILICON
[J].
MERTENS, RP
论文数:
0
引用数:
0
h-index:
0
MERTENS, RP
;
VANMEERBERGEN, JL
论文数:
0
引用数:
0
h-index:
0
VANMEERBERGEN, JL
;
NIJS, JF
论文数:
0
引用数:
0
h-index:
0
NIJS, JF
;
VANOVERSTRAETEN, RJ
论文数:
0
引用数:
0
h-index:
0
VANOVERSTRAETEN, RJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(05)
:949
-955
[12]
EXPERIMENTAL-STUDY OF THE MINORITY-CARRIER TRANSPORT AT THE POLYSILICON MONOSILICON INTERFACE
[J].
NEUGROSCHEL, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
NEUGROSCHEL, A
;
ARIENZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ARIENZO, M
;
KOMEM, Y
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KOMEM, Y
;
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ISAAC, RD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(04)
:807
-816
[13]
METHOD FOR DETERMINING THE EMITTER AND BASE SERIES RESISTANCES OF BIPOLAR-TRANSISTORS
[J].
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
;
TANG, DD
论文数:
0
引用数:
0
h-index:
0
TANG, DD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984,
31
(04)
:409
-412
[14]
EFFECT OF EMITTER CONTACT ON CURRENT GAIN OF SILICON BIPOLAR-DEVICES
[J].
NING, TH
论文数:
0
引用数:
0
h-index:
0
NING, TH
;
ISAAC, RD
论文数:
0
引用数:
0
h-index:
0
ISAAC, RD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(11)
:2051
-2055
[15]
CHARACTERIZATION OF NON-OHMIC BEHAVIOR OF EMITTER CONTACTS OF BIPOLAR-TRANSISTORS
[J].
RICCO, B
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
RICCO, B
;
STORK, JMC
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
STORK, JMC
;
ARIENZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ARIENZO, M
.
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(07)
:221
-223
[16]
SIMPLIFIED COMPUTER-AIDED ANALYSIS OF DOUBLE-DIFFUSED TRANSISTORS INCLUDING 2-DIMENSIONAL HIGH-LEVEL EFFECTS
[J].
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
;
SEHGAL, J
论文数:
0
引用数:
0
h-index:
0
SEHGAL, J
;
CHAMBERL.SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERL.SG
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(06)
:809
-&
[17]
MODELING AND MEASUREMENT OF MINORITY-CARRIER LIFETIME VERSUS DOPING IN DIFFUSED LAYERS OF N+-P SILICON DIODES
[J].
ROULSTON, DJ
论文数:
0
引用数:
0
h-index:
0
ROULSTON, DJ
;
ARORA, ND
论文数:
0
引用数:
0
h-index:
0
ARORA, ND
;
CHAMBERLAIN, SG
论文数:
0
引用数:
0
h-index:
0
CHAMBERLAIN, SG
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(02)
:284
-291
[18]
MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS
[J].
SLOTBOOM, JW
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
SLOTBOOM, JW
;
DEGRAAFF, HC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
DEGRAAFF, HC
.
SOLID-STATE ELECTRONICS,
1976,
19
(10)
:857
-862
[19]
SOEOWIRDJO B, 1983, SOLID STATE ELECTRON, V26, P495
[20]
HIGH-GAIN BIPOLAR-TRANSISTORS WITH POLYSILICON TUNNEL JUNCTION EMITTER CONTACTS
[J].
VANHALEN, P
论文数:
0
引用数:
0
h-index:
0
VANHALEN, P
;
PULFREY, DL
论文数:
0
引用数:
0
h-index:
0
PULFREY, DL
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(07)
:1307
-1313
←
1
2
3
→