HYDROGENATION OF INP BY PHOSPHINE PLASMA

被引:19
作者
SUGINO, T
YAMAMOTO, H
SHIRAFUJI, J
机构
[1] Department of Electrical Engineering, Suita Osaka, 565
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1991年 / 30卷 / 6A期
关键词
HYDROGENATION; INP; PH3; PLASMA; PHOTOLUMINESCENCE;
D O I
10.1143/JJAP.30.L948
中图分类号
O59 [应用物理学];
学科分类号
摘要
Hydrogenation of an InP surface has been attempted by the glow discharge of phosphine (PH3) gas diluted with Ar. Atomic P in the PH3 plasma is effective in suppressing the preferential etching of P at the InP surface which occurs easily by the exposure to the H2 plasma. The mirror surface of InP is found to be maintained after the plasma exposure even at 250-degrees-C. It is verified by secondary ion mass spectroscopy analysis that H atoms with a density higher than 1 x 10(18) cm-3 diffuse into the bulk InP to 500 nm in depth. An enhancement of the photoluminescence (PL) intensity occurs on the hydrogenated surface, and a complete recovery of the PL intensity is observed after annealing at 350-degrees-C for 3 min. In the case of exposure to the PH3 and H2 mixture plasma, an increase of the H2 flow rate leads to further enhancement of the PL intensity which is attributed to the band bending at the surface due to an introduction of P vacancies.
引用
收藏
页码:L948 / L957
页数:10
相关论文
共 13 条
  • [1] HYDROGEN PASSIVATION OF ACCEPTORS IN P-INP
    DAUTREMONTSMITH, WC
    LOPATA, J
    PEARTON, SJ
    KOSZI, LA
    STAVOLA, M
    SWAMINATHAN, V
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 66 (05) : 1993 - 1996
  • [2] SURFACE-DEFECTS AND FERMI-LEVEL PINNING IN INP
    DOW, JD
    ALLEN, RE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 659 - 661
  • [3] ELECTRON-MOBILITY STUDIES OF THE DONOR NEUTRALIZATION BY ATOMIC-HYDROGEN IN GAAS DOPED WITH SILICON
    JALIL, A
    CHEVALLIER, J
    AZOULAY, R
    MIRCEA, A
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (11) : 3774 - 3777
  • [4] HYDROGEN PASSIVATION OF THE OXYGEN-RELATED THERMAL-DONOR DEFECT IN SILICON
    JOHNSON, NM
    HAHN, SK
    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (11) : 709 - 711
  • [5] HYDROGEN PASSIVATION OF SHALLOW-ACCEPTOR IMPURITIES IN PARA-TYPE GAAS
    JOHNSON, NM
    BURNHAM, RD
    STREET, RA
    THORNTON, RL
    [J]. PHYSICAL REVIEW B, 1986, 33 (02): : 1102 - 1105
  • [6] OPTOELECTRONIC AND STRUCTURAL-PROPERTIES OF SPUTTER ETCHED SURFACES OF INP
    OLEGO, DJ
    SCHACHTER, R
    VISCOGLIOSI, M
    BUNZ, LA
    [J]. APPLIED PHYSICS LETTERS, 1986, 49 (12) : 719 - 721
  • [7] NEUTRALIZATION OF ACCEPTORS IN SILICON BY ATOMIC-HYDROGEN
    PANKOVE, JI
    WANCE, RO
    BERKEYHEISER, JE
    [J]. APPLIED PHYSICS LETTERS, 1984, 45 (10) : 1100 - 1102
  • [8] HYDROGENATION OF SHALLOW-DONOR LEVELS IN GAAS
    PEARTON, SJ
    DAUTREMONTSMITH, WC
    CHEVALLIER, J
    TU, CW
    CUMMINGS, KD
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (08) : 2821 - 2827
  • [9] SUPPRESSION OF INP SUBSTRATE DEGRADATION BY HYDROGEN PLASMA CAUSED BY THE PRESENCE OF PHOSPHORUS VAPOR
    SCHUTZ, R
    MATSUSHITA, K
    HARTNAGEL, HL
    LONGERE, JY
    KRAWCZYK, SK
    [J]. ELECTRONICS LETTERS, 1990, 26 (09) : 564 - 566
  • [10] PASSIVATION OF GRAIN-BOUNDARIES IN POLYCRYSTALLINE SILICON
    SEAGER, CH
    GINLEY, DS
    [J]. APPLIED PHYSICS LETTERS, 1979, 34 (05) : 337 - 340