SIMULTANEOUS FORMATION OF A SHALLOW SILICON P-N-JUNCTION AND A SHALLOW SILICIDE SILICON OHMIC CONTACT BY AN ION-IMPLANTATION TECHNIQUE

被引:10
作者
TSAUR, BY
ANDERSON, CH
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D O I
10.1063/1.93683
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O59 [应用物理学];
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页码:877 / 879
页数:3
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共 15 条
[1]   FORMATION OF SILICIDES IN MO-W BILAYER FILMS ON SI SUBSTRATES - MARKER EXPERIMENT [J].
BAGLIN, J ;
DEMPSEY, J ;
HAMMER, W ;
DHEURLE, F ;
PETERSSON, S ;
SERRANO, C .
JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (05) :641-661
[2]   GENERALIZED GUIDE FOR MOSFET MINIATURIZATION [J].
BREWS, JR ;
FICHTNER, W ;
NICOLLIAN, EH ;
SZE, SM .
ELECTRON DEVICE LETTERS, 1980, 1 (01) :2-4
[3]   THE EFFECT OF PHOSPHORUS ION-IMPLANTATION ON MOLYBDENUM-SILICON CONTACTS [J].
CHIANG, SW ;
CHOW, TP ;
REIHL, RF ;
WANG, KL .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) :4027-4032
[4]   REACTION-KINETICS OF MOLYBDENUM THIN-FILMS ON SILICON(111) SURFACE [J].
GUIVARCH, A ;
AUVRAY, P ;
BERTHOU, L ;
LECUN, M ;
BOULET, JP ;
HENOC, P ;
PELOUS, G ;
MARTINEZ, A .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (01) :233-237
[5]   FABRICATION AND THERMAL-STABILITY OF W-SI OHMIC CONTACTS [J].
KUMAR, V .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (02) :262-269
[6]   REACTION-KINETICS OF TUNGSTEN THIN-FILMS ON SILICON (100) SURFACES [J].
LOCKER, LD ;
CAPIO, CD .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) :4366-4369
[7]  
MORIMOTO M, 1981, P INT ELECTRON DEVIC, P655
[8]   HEXAGONAL WSI2 IN CO-SPUTTERED (TUNGSTEN AND SILICON) MIXTURE [J].
MURARKA, SP ;
READ, MH ;
CHANG, CC .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (12) :7450-7452
[9]   REFRACTORY SILICIDES FOR INTEGRATED-CIRCUITS [J].
MURARKA, SP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04) :775-792
[10]  
PETERSSON CS, 1980, THIN FILM INTERFACES, P290