TOTAL-DOSE RADIATION AND ANNEALING STUDIES - IMPLICATIONS FOR HARDNESS ASSURANCE TESTING

被引：73

作者：

WINOKUR, PS

SEXTON, FW

SCHWANK, JR

FLEETWOOD, DM

DRESSENDORFER, PV

WROBEL, TF

TURPIN, DC

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期

关键词：

D O I：

10.1109/TNS.1986.4334603

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1343 / 1351

页数：9

共 14 条

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[10] PHYSICAL-MECHANISMS CONTRIBUTING TO DEVICE REBOUND [J].

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TURPIN, DC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1434-1438

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