CORRELATIONS OF PLASMA PROPERTIES AND MAGNETIC-FIELD CHARACTERISTICS TO TIN FILM PROPERTIES FORMED USING A DUAL UNBALANCED MAGNETRON SYSTEM

被引:26
作者
ROHDE, SL [1 ]
SPROUL, WD [1 ]
ROHDE, JR [1 ]
机构
[1] UNIV WISCONSIN,DEPT CIVIL ENGN & MECH,MILWAUKEE,WI 53211
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1991年 / 9卷 / 03期
关键词
D O I
10.1116/1.577598
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A number of single-cathode "unbalanced" magnetron systems have recently been developed to obtained increased ion-current densities at the film surface during hard coating deposition; however, as with most single-cathode systems, shadowing effects often limit the types of substrates that can be coated in these units. The deposition system employed in this research utilizes a unique dual-cathode unbalanced dc-magnetron arrangement to coat specimens mounted on a rotational substrate holder, thereby gaining the benefits of unbalanced magnetrons while eliminating the shadowing effects commonly associated with single-cathode systems. This paired unbalanced magnetron system can be used to create a well-confined discharge, yielding high substrate ion-current densities (> 5 mA/cm2). In order to evaluate the effects of "unbalancing" on the depositional environment, the plasma and magnetic field characteristics are related to TiN film microstructures, properties, and crystallographic orientations. Microstructural investigations performed using scanning electron microscopy and cross-section transmission electron microscopy have demonstrated that the films possess fine columnar grain structures with no observable layering, and they are very near full density at substrate bias potentials of - 85 V and less.
引用
收藏
页码:1178 / 1183
页数:6
相关论文
共 17 条
[1]   A NEW TYPE OF TRANSDUCER FOR PARTIAL-PRESSURE CONTROL [J].
GOGOL, CA ;
MUELLER, R .
SURFACE & COATINGS TECHNOLOGY, 1988, 36 (3-4) :939-947
[2]   CROSS-SECTION PREPARATION FOR TEM OF FILM-SUBSTRATE COMBINATIONS WITH A LARGE DIFFERENCE IN SPUTTERING YIELDS [J].
HELMERSSON, U ;
SUNDGREN, JE .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 4 (04) :361-369
[3]   THE FORMATION AND CONTROL OF DIRECT-CURRENT MAGNETRON DISCHARGES FOR THE HIGH-RATE REACTIVE PROCESSING OF THIN-FILMS [J].
HOWSON, RP ;
SPENCER, AG ;
OKA, K ;
LEWIN, RW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1230-1234
[4]   REACTIVE DEPOSITION OF TIN FILMS USING AN UNBALANCED MAGNETRON [J].
KADLEC, S ;
MUSIL, J ;
MUNZ, WD ;
HAKANSON, G ;
SUNDGREN, JE .
SURFACE & COATINGS TECHNOLOGY, 1989, 39 (1-3) :487-497
[5]   REACTIVE SPUTTERING OF TIN FILMS AT LARGE SUBSTRATE TO TARGET DISTANCES [J].
MUSIL, J ;
KADLEC, S .
VACUUM, 1990, 40 (05) :435-444
[6]   MICROSTRUCTURE MODIFICATION OF TIN BY ION-BOMBARDMENT DURING REACTIVE SPUTTER DEPOSITION [J].
PETROV, I ;
HULTMAN, L ;
HELMERSSON, U ;
SUNDGREN, JE ;
GREENE, JE .
THIN SOLID FILMS, 1989, 169 (02) :299-314
[7]   ELECTROSTATIC-PROBE MEASUREMENTS IN THE GLOW-DISCHARGE PLASMA OF A DC MAGNETRON SPUTTERING SYSTEM [J].
PETROV, I ;
ORLINOV, V ;
IVANOV, I ;
KOURTEV, J .
CONTRIBUTIONS TO PLASMA PHYSICS, 1988, 28 (02) :157-167
[8]   EFFECTS OF AN UNBALANCED MAGNETRON IN A UNIQUE DUAL-CATHODE, HIGH-RATE REACTIVE SPUTTERING SYSTEM [J].
ROHDE, SL ;
PETROV, I ;
SPROUL, WD ;
BARNETT, SA ;
RUDNIK, PJ ;
GRAHAM, ME .
THIN SOLID FILMS, 1990, 193 (1-2) :117-126
[9]   UNBALANCED MAGNETRON ION-ASSISTED DEPOSITION AND PROPERTY MODIFICATION OF THIN-FILMS [J].
SAVVIDES, N ;
WINDOW, B .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :504-508
[10]   ACTIVATION OF REACTIVE SPUTTERING BY A PLASMA BEAM FROM AN UNBALANCED MAGNETRON [J].
SPENCER, AG ;
OKA, K ;
HOWSON, RP ;
LEWIN, RW .
VACUUM, 1988, 38 (8-10) :857-859