ELECTRONIC SURFACE-PROPERTIES OF CLEAVED GAP(110)

被引:22
作者
GUICHAR, GM
SEBENNE, CA
THUAULT, CD
机构
[1] Laboratoire de Physique des Solides, associé au Centre National de la Recherche Scientifique, Université Pierre et Marie Curie, F- 75230 Paris Cédex 05, 4, Place Jussieu
关键词
D O I
10.1016/0039-6028(79)90459-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electronic surface properties of UHV cleaved GaP (110) are investigated by contact potential difference measurements and photoemission yield spectroscopy. The p-type samples show practically no band bending; n-type GaP exhibits surface Fermi level stabilization about 1.65 eV above the valence band maximum. Two surface state bands are found in the gap. The importance of the first one, located near the valence band edge, depends on the cleavage. The other one is found in the upper part of the gap. An evaluation of the corresponding density of states shows it may correspond to the tail of an intrinsic surface band, mostly empty, the maximum of which would be closer to the conduction band. By comparing with results on other III-V compounds, it is suggested that a surface relaxation smaller for GaP than for GaAs may explain their different electronic properties. © 1979.
引用
收藏
页码:789 / 793
页数:5
相关论文
共 14 条
  • [1] ELECTRONIC-STRUCTURE AND ATOMIC CONFIGURATION AT CLEAVAGE SURFACE OF ZINCBLENDE COMPOUNDS
    CALANDRA, C
    MANGHI, F
    BERTONI, CM
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (11): : 1911 - 1927
  • [2] INTRINSIC SURFACE STATES IN 3-5 COMPOUNDS
    CALANDRA, C
    SANTORO, G
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1976, 9 (02): : L51 - L54
  • [3] CHADI DJ, UNPUBLISHED
  • [4] RELAXATION EFFECTS ON (110) SURFACE OF GAAS
    CHELIKOWSKY, JR
    LOUIE, SG
    COHEN, ML
    [J]. PHYSICAL REVIEW B, 1976, 14 (10) : 4724 - 4726
  • [5] ELECTRONIC SURFACE PROPERTIES OF 3-5 SEMICONDUCTORS - EXCITONIC EFFECTS, BAND-BENDING EFFECTS, AND INTERACTIONS WITH AU AND O ADSORBATE LAYERS
    GUDAT, W
    EASTMAN, DE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 831 - 837
  • [6] STRUCTURE DEPENDENT OXIDATION OF CLEAN SI(111) SURFACES
    GUICHAR, GM
    SEBENNE, CA
    GARRY, GA
    BALKANSKI, M
    [J]. SURFACE SCIENCE, 1976, 58 (02) : 374 - 378
  • [7] INTRINSIC AND DEFECT-INDUCED SURFACE-STATES OF CLEAVED GAAS(110)
    GUICHAR, GM
    SEBENNE, CA
    GARRY, GA
    [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (17) : 1158 - 1161
  • [8] GUICHAR GM, 1978, THESIS U PIERRE MARI
  • [9] ELECTRONIC SURFACE PROPERTIES OF UHV-CLEAVED 3-5 COMPOUNDS
    HUIJSER, A
    VANLAAR, J
    VANROOY, TL
    [J]. SURFACE SCIENCE, 1977, 62 (02) : 472 - 486
  • [10] SEMICONDUCTOR SURFACE RECONSTRUCTION - RIPPLED GEOMETRY OF GAAS(110)
    LUBINSKY, AR
    DUKE, CB
    LEE, BW
    MARK, P
    [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (17) : 1058 - 1061