PHOTOCAPACITANCE SPECTROSCOPY OF THIN-FILM CADMIUM SELENIDE ELECTRODES

被引：8

作者：

COCIVERA, M ^{[1
]}

SEARS, WM ^{[1
]}

MORRISON, SR ^{[1
]}

机构：

[1] SIMON FRASER UNIV,ENERGY RES INST,BURNABY V5A 1S6,BC,CANADA

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1987年 / 216卷 / 1-2期

关键词：

We are indebted to J. Szabo for preparation of the films: This work was supportedi n part by grants( to M.C. and S.R.M.) from the Natural Sciencesa nd EngineeringR esearchC ouncil of Canada.M .C. wishest o thankt he PhysicsD epart-ment of Simon Fraser University for its hospitality;

D O I：

10.1016/0022-0728(87)80196-1

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：41 / 52

页数：12

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