PARALLEL STRESS AND PERPENDICULAR STRAIN DEPTH DISTRIBUTIONS IN [001] SILICON AMORPHIZED BY ION-IMPLANTATION

被引:8
作者
FABBRI, R
SERVIDORI, M
ZANI, A
机构
关键词
D O I
10.1063/1.343830
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4715 / 4718
页数:4
相关论文
共 13 条
[1]   RELATIONS BETWEEN STRUCTURE AND OPTICAL AND ELECTRICAL PROPERTIES OF AMORPHOUS SI AND GE FILMS [J].
BRODSKY, MH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01) :125-&
[2]   LATTICE COMPRESSION FROM CONDUCTION ELECTRONS IN HEAVILY DOPED SI-AS [J].
CARGILL, GS ;
ANGILELLO, J ;
KAVANAGH, KL .
PHYSICAL REVIEW LETTERS, 1988, 61 (15) :1748-1751
[3]   DOUBLE-CRYSTAL X-RAY-DIFFRACTION ANALYSIS OF LOW-TEMPERATURE ION-IMPLANTED SILICON [J].
CEMBALI, F ;
SERVIDORI, M ;
ZANI, A .
SOLID-STATE ELECTRONICS, 1985, 28 (09) :933-&
[4]  
CEMBALI F, 1989, J APPL CRYSTALLOGR, V23, P345
[5]  
KORITAR D, 1984, J PHYS B ATOM MOL PH, V34, P1277
[6]   STUDIES OF LATTICE DISTORTION AND CRYSTAL CURVATURE IN ARSENIC-IMPLANTED SILICON [J].
KUO, CL ;
KAO, YH ;
ARNOLD, E ;
BILELLO, JC .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) :1791-1794
[7]   EVIDENCE OF VOIDS WITHIN AS-DEPOSITED STRUCTURE OF GLASSY SILICON [J].
MOSS, SC ;
GRACZYK, JF .
PHYSICAL REVIEW LETTERS, 1969, 23 (20) :1167-&
[8]  
Polk D. E., 1971, Journal of Non-Crystalline Solids, V5, P365, DOI 10.1016/0022-3093(71)90038-X
[9]   DEFECT DISTRIBUTION IN ION-IMPLANTED SILICON - COMPARISON BETWEEN MONTE-CARLO SIMULATION AND TRIPLE CRYSTAL X-RAY MEASUREMENTS [J].
SERVIDORI, M ;
ZAUMSEIL, P ;
WINTER, U ;
CEMBALI, F ;
MAZZONE, AM .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 22 (04) :497-498
[10]   ACCURACY IN X-RAY ROCKING-CURVE ANALYSIS AS A NECESSARY REQUIREMENT FOR REVEALING VACANCIES AND INTERSTITIALS IN REGROWN SILICON LAYERS AMORPHIZED BY ION-IMPLANTATION [J].
SERVIDORI, M ;
CEMBALI, F .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 (02) :176-181