DETERMINATION OF DEFORMATION POTENTIAL CONSTANTS FROM ELECTRON CYCLOTRON RESONANCE IN GERMANIUM AND SILICON

被引：63

作者：

MURASE, K

ENJOIJI, K

OTSUKA, E

机构：

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1970年 / 29卷 / 05期

关键词：

D O I：

10.1143/JPSJ.29.1248

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：1248 / &

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[41] QUANTUM TRANSPORT STUDY OF SILICON AND GERMANIUM BY 4-MM WAVE CYCLOTRON RESONANCE BELOW 1 DEGREES K
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[46] OBSERVATION OF RESOLVED QUANTUM LINES IN UNIAXIALLY STRESSED GERMANIUM
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[J]. PHYSICS LETTERS, 1966, 21 (03): : 284 - &
[47] CYCLOTRON RESONANCE OF DOPED SILICON
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