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X-RAY-DIFFRACTION IN A PERFECT CRYSTAL WITH DISTURBED SURFACE-LAYER
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DYNAMICAL TREATMENT OF THERMAL DIFFUSE SCATTERING OF X-RAYS
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STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF BORON IMPLANTED IN PREAMORPHIZED SILICON LAYERS
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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
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EFFECT OF DIFFUSE-SCATTERING IN THE STRAIN PROFILE DETERMINATION BY DOUBLE CRYSTAL X-RAY-DIFFRACTION
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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
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DETERMINATION OF STRAIN DISTRIBUTIONS FROM X-RAY BRAGG REFLECTION BY SILICON SINGLE-CRYSTALS
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SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER
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THE METHOD OF INTEGRAL CHARACTERISTICS IN X-RAY-DIFFRACTION STUDIES OF THE STRUCTURE OF THE SURFACE-LAYERS OF SINGLE-CRYSTALS
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