共 13 条
[1]
NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1990, 8 (01)
:429-433
[3]
MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1990, 8 (04)
:3386-3396
[5]
ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE
[J].
EUROPHYSICS LETTERS,
1987, 3 (12)
:1281-1286
[6]
MICROPATTERN MEASUREMENT WITH AN ATOMIC FORCE MICROSCOPE
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1991, 9 (02)
:666-669
[7]
ELECTRON-BEAM-INDUCED RESIST AND ALUMINUM FORMATION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1991, 9 (01)
:169-172
[8]
HIGH-RESOLUTION ELECTRON-BEAM INDUCED DEPOSITION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (01)
:477-481
[9]
LEE K, 1991, 35TH P INT S EL ION
[10]
DIRECT ELECTRON-BEAM PATTERNING FOR NANOLITHOGRAPHY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1989, 7 (06)
:1941-1946