共 32 条
- [12] DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 495 - 499
- [13] EFFECT OF THE MICROSCOPIC ELECTRONIC STATES OF THE TIP ON THE SCANNING TUNNELING MICROSCOPY IMAGE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 174 - 176
- [14] PROBING OF BASAL PLANES OF MOS2 BY SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1988, 52 (26) : 2252 - 2254
- [15] CHARGE-DENSITY WAVES STUDIED WITH THE USE OF A SCANNING TUNNELING MICROSCOPE [J]. PHYSICAL REVIEW B, 1986, 34 (02): : 994 - 1005
- [17] VOLTAGE-DEPENDENT SCANNING TUNNELING MICROSCOPY IMAGING OF SEMICONDUCTOR SURFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 499 - 507
- [18] IMAGING OF MOS2 BY SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1987, 51 (19) : 1560 - 1562
- [19] SCANNING TUNNELING MICROSCOPY OF THE CLEAVED SURFACE OF BI2SR2CACU2O8 [J]. PHYSICA C, 1988, 156 (01): : 177 - 183
- [20] DIRECT FORCE MEASUREMENT IN SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 188 - 190