ELECTROMIGRATION FAILURE AT ALUMINUM-SILICON CONTACTS

被引：13

作者：

PROKOP, GS

JOSEPH, RR

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 06期

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D O I：

10.1063/1.1661564

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：2595 / &

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