THE ROLE OF INTERFACE TRAPS IN REBOUND MECHANISMS

被引：3

作者：

GOLUBOVIC, S

RISTIC, G

PEJOVIC, M

DIMITRIJEV, S

机构：

[1] Division of Science and Technology, School of Microelectronic Engineering, Griffith University, Brisbane, Queensland, 4111, Nathan

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1994年 / 143卷 / 02期

关键词：

Interface traps - Rebound mechanisms;

D O I：

10.1002/pssa.2211430217

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Postirradiation effect measurements on NMOS Al-gate transistors are performed. Rebound failures are demonstrated during the bias-thermal annealing. It is established that the interface traps, created during irradiation, are responsible for rebound.

引用

页码：333 / 339

页数：7

共 11 条

[1] ANALYSIS OF CMOS TRANSISTOR INSTABILITIES [J].

DIMITRIJEV, S ;

STOJADINOVIC, N .

SOLID-STATE ELECTRONICS, 1987, 30 (10) :991-1003

[2] RESPONSE OF INTERFACE TRAPS DURING HIGH-TEMPERATURE ANNEALS [J].

LELIS, AJ ;

OLDHAM, TR ;

DELANCEY, WM .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1590-1597

[3] REVERSIBILITY OF TRAPPED HOLE ANNEALING [J].

LELIS, AJ ;

BOESCH, HE ;

OLDHAM, TR ;

MCLEAN, FB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1186-1191

[4]

Ma T. P., 1989, IONIZING RAD EFFECTS

[5] MODELING THE ANNEAL OF RADIATION-INDUCED TRAPPED HOLES IN A VARYING THERMAL ENVIRONMENT [J].

MCWHORTER, PJ ;

MILLER, SL ;

MILLER, WM .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1682-1689

[6]

NICOLLIAN EH, 1982, MOS PHYSICS TECHNOLO

[7]

PEJOVIC M, IN PRESS JAPAN J APP

[8] 2-REACTION MODEL OF INTERFACE TRAP ANNEALING [J].

REED, ML ;

PLUMMER, JD .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1198-1202

[9] DETERMINATION OF INTERFACE-STATE DENSITY AND MOBILITY RATIO IN SILICON SURFACE INVERSION LAYERS [J].

SAKAKI, H ;

HOH, K ;

SUGANO, T .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1970, ED17 (10) :892-+

[10] IRRADIATED SILICON GATE MOS DEVICE BIAS ANNEALING [J].

SCHWANK, JR ;

DAWES, WR .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4100-4104

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