Double-doped In0.35Al0.65As/In0.35Ga0.65As power heterojunction FET on GaAs substrate with 1 W output power

被引:21
作者
Contrata, W [1 ]
Iwata, N [1 ]
机构
[1] NEC Corp Ltd, Kansai Elect Res Labs, Shiga 5200833, Japan
关键词
Carrier concentration - Crystal lattices - Electric breakdown - Etching - Heterojunctions - Molecular beam epitaxy - Semiconducting aluminum compounds - Semiconducting gallium arsenide - Semiconducting indium compounds - Semiconducting silicon;
D O I
10.1109/55.772379
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A double-doped metamorphic In0.35Al0.65As/In0.35Ga0.65As power heterojunction FET (HJFET) on GaAs substrate is demonstrated. The HJFET exhibits good de characteristics, with gate forward turn on voltage of 1.0 V, breakdown voltage of 20 V, and maximum drain current of 490 mA/mm, Under RF operation at a frequency of 950 MHz, a power added efficiency of 63% with associated output power of 31.7 dBm is obtained at a gate width of 12.8 mm, This large gate width and state-of-the-art power performance in metamorphic HJFETS were enabled by a selective etching, sputtered WSI gate process and low surface roughness due to an Al0.60Ga0.40As0.69Sb0.31 strain relief buffer.
引用
收藏
页码:369 / 371
页数:3
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