Site-specific force-distance characteristics on NaCl(001):: Measurements versus atomistic simulations

被引：29

作者：

Lantz, M. A.

Hoffmann, R.

Foster, A. S.

Baratoff, A.

Hug, H. J.

Hidber, H. R.

Guentherodt, H.-J.

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

[2] Aalto Univ, Phys Lab, Helsinki 02015, Finland

[3] Univ Basel, NCCR Nanoscale Sci, CH-4056 Basel, Switzerland

来源：

PHYSICAL REVIEW B | 2006年 / 74卷 / 24期

关键词：

D O I：

10.1103/PhysRevB.74.245426

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A scanning force microscope was used to measure the frequency shift above various atomic sites on a NaCl(001) surface at 7 K. The data was converted to force and compared to the results of atomistic simulations using model NaCl and MgO tips. We find that the NaCl tip demonstrates better agreement in the magnitude of the forces in experiments, supporting the observation that the tip first came into contact with the sample. Using the MgO tip as a model of the originally oxidized silicon tip, we further demonstrate a possible mechanism for tip contamination at low temperatures.

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页数：9

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