Nanometric artificial structuring of semiconductor surfaces for crystalline growth

被引:8
作者
Eymery, J
Biasiol, G
Kapon, E
Ogino, T
机构
[1] UJF, Equipe Mixte, CNRS, CEA,DRFM,SP2M, F-38054 Grenoble 9, France
[2] Swiss Fed Inst Technol, Inst Quantum Elect & Photon, Lab Phys & Nanostruct, CH-1015 Lausanne, Switzerland
[3] Yokohama Natl Univ, Dept Elect & Comp Engn, Yokohama, Kanagawa 2408601, Japan
关键词
surface nanopatterning; self-assembling; epitaxial growth; strain and curvature engineering;
D O I
10.1016/j.crhy.2004.11.006
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The coupling of standard self-organization methods with surface artificial nanostructuring has recently emerged as a promising technique in semiconductor materials to control simultaneously the size distribution, the density and the position of epitaxial nanostructures. Some physical aspects of the morphology and elastic strain engineering are reviewed in this article. The emphasis is on the effects of capillarity, growth rate anisotropy, strain relaxation and entropy of mixing for alloys. The interplay among these driving forces is first illustrated by III-V compound semiconductor growth on lithographically patterned surfaces, then by germanium growth on implanted substrates and nanopatterned templates obtained by chemical etching of buried strain dislocation networks. (C) 2004 Academie des sciences. Published by Elsevier SAS. All rights reserved.
引用
收藏
页码:105 / 116
页数:12
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