High-performance and electrically stable C60 organic field-effect transistors

被引:89
作者
Zhang, X.-H. [1 ]
Domercq, B. [1 ]
Kippelen, B. [1 ]
机构
[1] Georgia Inst Technol, COPE, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2778472
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors report on high-performance C-60 organic field-effect transistors fabricated by physical vapor deposition. Electron mobility ranging from 2.7 to 5.0 cm(2)/V s was achieved when treating the gate dielectric with divinyltetramethyldisiloxane bis(benzocyclobutene) and depositing C-60 at room temperature. The transistors combine threshold voltages near zero, low subthreshold slopes (< 0.7 V/decade), on/off current ratios larger than 10(6), excellent reproducibility, and good electrical stability under prolonged continuous dc bias stress.
引用
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页数:3
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