Photoelectron spectromicroscopy: present and future

被引：79

作者：

Bauer, E ^{[1
]}

机构：

[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2001年 / 114卷

关键词：

microscopy; spectroscopy; diffraction; cathode lens; energy filter; aberration correction;

D O I：

10.1016/S0368-2048(00)00261-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The fundamentals, the present state and the future prospects of photoelectron spectromicroscopy, microspectroscopy and microdiffraction in parallel imaging immersion lens/cathode lens electron microscopes are reviewed. The emphasis is on the instrumental aspects and on the experimental possibilities and limitations that are illustrated by some application examples. Special attention is given to the combination with nonspectroscopic imaging methods such as low energy electron microscopy and mirror microscopy that are possible with appropriately configured systems. Such multi-method instruments are expected to play a major role in the future. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：975 / 987

页数：13

共 43 条

[31] SHAO Z, 1990, OPTIK, V84, P51
[32] PROPERTIES OF A 4-ELECTRODE ADJUSTABLE ELECTRON-MIRROR AS AN ABERRATION CORRECTOR
SHAO, ZF
WU, XD
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (04) : 1230 - 1235
[33] ADJUSTABLE 4-ELECTRODE ELECTRON-MIRROR AS AN ABERRATION CORRECTOR
SHAO, ZF
WU, XD
[J]. APPLIED PHYSICS LETTERS, 1989, 55 (26) : 2696 - 2697
[34] A PROPOSED MODULAR IMAGING-SYSTEM FOR PHOTOELECTRON AND ELECTRON-PROBE MICROSCOPY WITH ABERRATION CORRECTION, AND FOR MIRROR MICROSCOPY AND LOW-ENERGY ELECTRON-MICROSCOPY
SKOCZYLAS, WP
REMPFER, GF
GRIFFITH, OH
[J]. ULTRAMICROSCOPY, 1991, 36 (1-3) : 252 - 261
[35] A photoemission microscope with a hemispherical capacitor energy filter
Tonner, BP
Dunham, D
Droubay, T
Pauli, M
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1997, 84 (1-3) : 211 - 229
[36] AN ELECTROSTATIC MICROSCOPE FOR SYNCHROTRON RADIATION X-RAY ABSORPTION MICROSPECTROSCOPY
TONNER, BP
HARP, GR
KORANDA, SF
ZHANG, J
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) : 564 - 568
[37] ENERGY-FILTERED IMAGING WITH ELECTROSTATIC OPTICS FOR PHOTOELECTRON MICROSCOPY
TONNER, BP
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 291 (1-2) : 60 - 66
[38] PHOTOYIELD SPECTROMICROSCOPY OF SILICON SURFACES USING MONOCHROMATIC SYNCHROTRON RADIATION
TONNER, BP
HARP, GR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (01): : 1 - 4
[39] A new low energy electron microscope
Tromp, RM
Mankos, M
Reuter, MC
Ellis, AW
Copel, M
[J]. SURFACE REVIEW AND LETTERS, 1998, 5 (06) : 1189 - 1197
[40] DESIGN OF A SPECTROSCOPIC LOW-ENERGY ELECTRON-MICROSCOPE
VENEKLASEN, LH
[J]. ULTRAMICROSCOPY, 1991, 36 (1-3) : 76 - 90

← 1 2 3 4 5 →