ZnO p-n homojunctions and ohmic contacts to Al-N-co-doped p-type ZnO -: art. no. 092103

被引:90
作者
Zhuge, F [1 ]
Zhu, LP
Ye, ZZ
Ma, DW
Lu, JG
Huang, JY
Wang, FZ
Ji, ZG
Zhang, SB
机构
[1] Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
[2] Natl Renewable Energy Lab, Golden, CO 80401 USA
基金
中国国家自然科学基金;
关键词
D O I
10.1063/1.2012521
中图分类号
O59 [应用物理学];
学科分类号
摘要
ZnO p-n homojunctions were fabricated on quartz substrates by depositing Al-doped n-type ZnO layer on Al-N-co-doped p-type ZnO layer through reactive magnetron sputtering. In/Zn metal contacts to as-grown ZnO show ohmic behavior, and the ohmic contacts can be improved by annealing in an Ar ambient. The optimal annealing temperatures for Al-N-co-doped ZnO and Al-doped ZnO are 550 degrees C and 600 degrees C, respectively. The p-n junction characteristic is confirmed by current-voltage measurements. The turn-on voltage is 2 V, with a low leakage current under reverse bias. Series resistances of the ZnO p-n junctions can be lowered by optimizing the annealing temperature, increasing the grain size of the ZnO, or increasing the hole concentration of the p layer.
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页数:3
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