High resolution imaging of thin-film recording heads by superparamagnetic magnetic force microscopy tips

被引：19

作者：

Liou, SH

Malhotra, SS

Moreland, J

Hopkins, PF

机构：

[1] UNIV NEBRASKA,DEPT PHYS & ASTRON,LINCOLN,NE 68588

[2] UNIV NEBRASKA,CTR MAT RES & ANAL,LINCOLN,NE 68588

[3] NATL INST STAND & TECHNOL,BOULDER,CO 80303

[4] QUANTUM PERIPHERALS COLORADO,LOUISVILLE,CO 80028

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 01期

关键词：

D O I：

10.1063/1.119286

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used superparamagnetic magnetic force microscopy (MFM) tips to obtain high spatial resolution MFM images of recording heads. Profiles of the magnetic field gradient above a thin-film recording head under 3 mA bias current to the head and various tip-head distance conditions are presented. At a low tip-head distance, the gap width, gap location, and gap-field structure can be well resolved in these MFM images. Superparamagnetic tips show promise for the magnetic imaging of recording heads with gap widths below 200 nm. (C) 1997 American Institute of Physics.

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收藏

页码：135 / 137

页数：3

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