Recent progress in resistive random access memories: Materials, switching mechanisms, and performance

被引:1239
作者
Pan, F. [1 ]
Gao, S. [1 ]
Chen, C. [1 ]
Song, C. [1 ]
Zeng, F. [1 ]
机构
[1] Tsinghua Univ, Sch Mat Sci & Engn, Key Lab Adv Mat MOE, Beijing 100084, Peoples R China
基金
中国国家自然科学基金;
关键词
Resistive switching; Resistive random access memory; Nonvolatile memory; Memristor; Organic resistive memory; ORGANIC NONVOLATILE MEMORY; IN-SITU OBSERVATION; ATOMIC LAYER DEPOSITION; REAL-TIME OBSERVATION; HIGH-CURRENT-DENSITY; THIN-FILMS; OPERATION VOLTAGE; BISTABLE DEVICES; ROOM-TEMPERATURE; CONDUCTANCE QUANTIZATION;
D O I
10.1016/j.mser.2014.06.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This review article attempts to provide a comprehensive review of the recent progress in the so-called resistive random access memories (RRAMs). First, a brief introduction is presented to describe the construction and development of RRAMs, their potential for broad applications in the fields of nonvolatile memory, unconventional computing and logic devices, and the focus of research concerning RRAMs over the past decade. Second, both inorganic and organic materials used in RRAMs are summarized, and their respective advantages and shortcomings are discussed. Third, the important switching mechanisms are discussed in depth and are classified into ion migration, charge trapping/de-trapping, thermochemical reaction, exclusive mechanisms in inorganics, and exclusive mechanisms in organics. Fourth, attention is given to the application of RRAMs for data storage, including their current performance, methods for performance enhancement, sneak-path issue and possible solutions, and demonstrations of 2-D and 3-D crossbar arrays. Fifth, prospective applications of RRAMs in unconventional computing, as well as logic devices and multi-functionalization of RRAMs, are comprehensively summarized and thoroughly discussed. The present review article ends with a short discussion concerning the challenges and future prospects of the RRAMs. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 59
页数:59
相关论文
共 444 条
[101]   Atomic Layer Deposition: An Overview [J].
George, Steven M. .
CHEMICAL REVIEWS, 2010, 110 (01) :111-131
[102]   Conductance Switching in TiO2 Nanorods is a Redox-Driven Process: Evidence from Photovoltaic Parameters [J].
Ghosh, Batu ;
Pal, Amlan J. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2009, 113 (42) :18391-18395
[103]   SWITCHING PROPERTIES OF THIN NIO FILMS [J].
GIBBONS, JF ;
BEADLE, WE .
SOLID-STATE ELECTRONICS, 1964, 7 (11) :785-&
[104]   Highly-Scalable Novel Access Device based on Mixed Ionic Electronic Conduction (MIEC) Materials for High Density Phase Change Memory (PCM) Arrays [J].
Gopalakrishnan, K. ;
Shenoy, R. S. ;
Rettner, C. T. ;
Virwani, K. ;
Bethune, D. S. ;
Shelby, R. M. ;
Burr, G. W. ;
Kellock, A. ;
King, R. S. ;
Nguyen, K. ;
Bowers, A. N. ;
Jurich, M. ;
Jackson, B. ;
Friz, A. M. ;
Topuria, T. ;
Rice, P. M. ;
Kurdi, B. N. .
2010 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2010, :205-206
[105]   Influence of the Cu-Te composition and microstructure on the resistive switching of Cu-Te/Al2O3/Si cells [J].
Goux, L. ;
Opsomer, K. ;
Degraeve, R. ;
Muller, R. ;
Detavernier, C. ;
Wouters, D. J. ;
Jurczak, M. ;
Altimime, L. ;
Kittl, J. A. .
APPLIED PHYSICS LETTERS, 2011, 99 (05)
[106]  
Govoreanu B, 2011, 2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)
[107]   Nonpolar nonvolatile resistive switching in Cu doped ZrO2 [J].
Guan, Weihua ;
Long, Shibing ;
Liu, Qi ;
Liu, Ming ;
Wang, Wei .
IEEE ELECTRON DEVICE LETTERS, 2008, 29 (05) :434-437
[108]   Avalanche breakdown in GaTa4Se8 - xTex narrow-gap Mott insulators [J].
Guiot, V. ;
Cario, L. ;
Janod, E. ;
Corraze, B. ;
Phuoc, V. Ta ;
Rozenberg, M. ;
Stoliar, P. ;
Cren, T. ;
Roditchev, D. .
NATURE COMMUNICATIONS, 2013, 4
[109]   Resistive switching devices based on nanocrystalline solid electrolyte (AgI)0.5(AgPO3)0.5 [J].
Guo, H. X. ;
Yang, B. ;
Chen, L. ;
Xia, Y. D. ;
Yin, K. B. ;
Liu, Z. G. ;
Yin, J. .
APPLIED PHYSICS LETTERS, 2007, 91 (24)
[110]   Understanding the switching-off mechanism in Ag+ migration based resistively switching model systems [J].
Guo, Xin ;
Schindler, Christina .
APPLIED PHYSICS LETTERS, 2007, 91 (13)