Elasticity, strength, and toughness of single crystal silicon carbide, ultrananocrystalline diamond, and hydrogen-free tetrahedral amorphous carbon

被引:63
作者
Espinosa, H. D. [1 ]
Peng, B.
Moldovan, N.
Friedmann, T. A.
Xiao, X.
Mancini, D. C.
Auciello, O.
Carlisle, J.
Zorman, C. A.
Merhegany, M.
机构
[1] Northwestern Univ, Evanston, IL 60208 USA
[2] Sandia Natl Labs, Albuquerque, NM 87185 USA
[3] Argonne Natl Lab, Argonne, IL 60439 USA
[4] Case Western Reserve Univ, Cleveland, OH 44106 USA
关键词
D O I
10.1063/1.2336220
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, the authors report the mechanical properties of three emerging materials in thin film form: single crystal silicon carbide (3C-SiC), ultrananocrystalline diamond, and hydrogen-free tetrahedral amorphous carbon. The materials are being employed in micro- and nanoelectromechanical systems. Several reports addressed some of the mechanical properties of these materials but they are based in different experimental approaches. Here, they use a single testing method, the membrane deflection experiment, to compare these materials' Young's moduli, characteristic strengths, fracture toughnesses, and theoretical strengths. Furthermore, they analyze the applicability of Weibull theory [Proc. Royal Swedish Inst. Eng. Res. 153, 1 (1939); ASME J. Appl. Mech. 18, 293 (1951)] in the prediction of these materials' failure and document the volume- or surface-initiated failure modes by fractographic analysis. The findings are of particular relevance to the selection of micro- and nanoelectromechanical systems materials for various applications of interest. (c) 2006 American Institute of Physics.
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页数:3
相关论文
共 18 条
[1]   Fracture strength of polysilicon at stress concentrations [J].
Bagdahn, J ;
Sharpe, WN ;
Jadaan, O .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2003, 12 (03) :302-312
[2]   The fracture toughness of polysilicon microdevices: A first report [J].
Ballarini, R ;
Mullen, RL ;
Yin, Y ;
Kahn, H ;
Stemmer, S ;
Heuer, AH .
JOURNAL OF MATERIALS RESEARCH, 1997, 12 (04) :915-922
[3]   Micromechanical testing of MEMS materials [J].
Buchheit, TE ;
Glass, SJ ;
Sullivan, JR ;
Mani, SS ;
Lavan, DA ;
Friedmann, TA ;
Janek, R .
JOURNAL OF MATERIALS SCIENCE, 2003, 38 (20) :4081-4086
[4]   Young's modulus, Poisson's ratio and failure properties of tetrahedral amorphous diamond-like carbon for MEMS devices [J].
Cho, S ;
Chasiotis, I ;
Friedmann, TA ;
Sullivan, JP .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2005, 15 (04) :728-735
[5]   Fracture strength of ultrananocrystalline diamond thin films - identification of Weibull parameters [J].
Espinosa, HD ;
Peng, B ;
Prorok, BC ;
Moldovan, N ;
Auciello, O ;
Carlisle, JA ;
Gruen, DM ;
Mancini, DC .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (09) :6076-6084
[6]   A new methodology to investigate fracture toughness of freestanding MEMS and advanced materials in thin film form [J].
Espinosa, HD ;
Peng, B .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2005, 14 (01) :153-159
[7]   A methodology for determining mechanical properties of freestanding thin films and MEMS materials [J].
Espinosa, HD ;
Prorok, BC ;
Fischer, M .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2003, 51 (01) :47-67
[8]  
FREIMAN SW, 1990, CERAM T, V17, P55
[9]   Nanocrystalline diamond films [J].
Gruen, DM .
ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 :211-259
[10]   Mechanical properties of epitaxial 3C silicon carbide thin films [J].
Jackson, KM ;
Dunning, J ;
Zorman, CA ;
Mehregany, M ;
Sharpe, WN .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2005, 14 (04) :664-672