Compositional influence on sol-gel-derived amorphous oxide semiconductor thin film transistors

被引:60
作者
Kim, Dongjo [1 ]
Koo, Chang Young [1 ]
Song, Keunkyu [1 ]
Jeong, Youngmin [1 ]
Moon, Jooho [1 ]
机构
[1] Yonsei Univ, Dept Mat Sci & Engn, Seoul 120749, South Korea
关键词
amorphous semiconductors; gallium compounds; indium compounds; organic field effect transistors; semiconductor growth; sol-gel processing; thin film transistors; ZINC-OXIDE; TEMPERATURE;
D O I
10.1063/1.3225555
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the influence of the chemical compositions of gallium and indium cations on the performance of sol-gel-derived amorphous gallium indium zinc oxide (a-GIZO)-based thin film transistors (TFTs). A systematic compositional study allowed us to understand the solution-processed a-GIZO TFTs. We generated a compositional ternary diagram from which we could predict electrical parameters such as saturation mobility, threshold voltage, and the on/off current ratio as the constituent compositions varied. This diagram can be utilized for tailoring solution-processed amorphous oxide TFTs for specific applications.
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页数:3
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共 17 条
[1]   Plasma-enhanced chemical vapor deposition of zinc oxide at atmospheric pressure and low temperature [J].
Barankin, M. D. ;
Gonzalez, E., II ;
Ladwig, A. M. ;
Hicks, R. F. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2007, 91 (10) :924-930
[2]   Influence of the semiconductor thickness on the electrical properties of transparent TFTs based on indium zinc oxide [J].
Barquinha, P. ;
Pimentel, A. ;
Marques, A. ;
Pereira, L. ;
Martins, R. ;
Fortunato, E. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) :1749-1752
[3]   High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer [J].
Chiang, HQ ;
Wager, JF ;
Hoffman, RL ;
Jeong, J ;
Keszler, DA .
APPLIED PHYSICS LETTERS, 2005, 86 (01) :013503-1
[4]   Transparent thin-film transistors with zinc indium oxide channel layer [J].
Dehuff, NL ;
Kettenring, ES ;
Hong, D ;
Chiang, HQ ;
Wager, JF ;
Hoffman, RL ;
Park, CH ;
Keszler, DA .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (06)
[5]   Effects of channel stoichiometry and processing temperature on the electrical characteristics of zinc tin oxide thin-film transistors [J].
Hoffman, R. L. .
SOLID-STATE ELECTRONICS, 2006, 50 (05) :784-787
[7]   Combinatorial approach to thin-film transistors using multicomponent semiconductor channels: An application to amorphous oxide semiconductors in In-Ga-Zn-O system [J].
Iwasaki, Tatsuya ;
Itagaki, Naho ;
Den, Tohru ;
Kumomi, Hideya ;
Nomura, Kenji ;
Kamiya, Toshio ;
Hosono, Hideo .
APPLIED PHYSICS LETTERS, 2007, 90 (24)
[8]   Formation Mechanism of Solution-Processed Nanocrystalline InGaZnO Thin Film as Active Channel Layer in Thin-Film Transistor [J].
Kim, Gun Hee ;
Shin, Hyun Soo ;
Ahn, Byung Du ;
Kim, Kyung Ho ;
Park, Won Jun ;
Kim, Hyun Jae .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2009, 156 (01) :H7-H9
[9]   High performance solution-processed indium oxide thin-film transistors [J].
Kim, Hyun Sung ;
Byrne, Paul D. ;
Facchetti, Antonio ;
Marks, Tobin J. .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2008, 130 (38) :12580-+
[10]   Sol-gel derived Ga-In-Zn-O semiconductor layers for solution-processed thin-film transistors [J].
Koo, Chang Young ;
Kim, Dongjo ;
Jeong, Sunho ;
Moon, Jooho ;
Park, Chiyoung ;
Jeon, Minhyon ;
Sin, Won-Chol ;
Jung, Jinha ;
Woo, Hyun-Jung ;
Kim, Seung-Hyun ;
Ha, Jowoong .
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (01) :218-222