In this study, we report on an innovative residue-free nanoimprint lithography process for the patterning of submicron-spaced contacts, used as source and drain electrodes in down-scaled organic thin-film transistors. The method is based on thermally initiated radical polymerization of a novel imprint resist whose outstanding chemical and physical properties are responsible for the excellent results in processability and structure transfer. In combination with a pretreated stamp the thermally curable resist enables residue-free imprinting, thus making etching obsolete. In addition, this process implies only moderate temperature budgets and it is eco-friendly due to a water-based lift-off. To validate the process, source and drain patterned submicron organic thin-film transistors with pentacene as the semiconductor were fabricated, which show excellent transistor behavior parameterized by a low switch-on voltage of V-so = -3 V, an on-off ratio of more than 10(5) and a charge carrier mobility of mu = 0.25 cm(2)/V s. (C) 2009 Elsevier B. V. All rights reserved.
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Cheng, X
;
Li, DW
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Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Li, DW
;
Guo, LJ
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Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Cheng, X
;
Li, DW
论文数: 0引用数: 0
h-index: 0
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Li, DW
;
Guo, LJ
论文数: 0引用数: 0
h-index: 0
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA