STUDY OF THERMALLY INDUCED DEEP LEVELS IN AL-DOPED SI

被引:27
作者
MARCHAND, RL
SAH, CT
机构
[1] UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
关键词
D O I
10.1063/1.323383
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:336 / 341
页数:6
相关论文
共 17 条
[1]  
BUBE RH, 1956, PHOTOCONDUCTIVITY SO
[2]   ABSORPTION SPECTRA OF IMPURITIES IN SILICON .1. GROUP-III ACCEPTORS [J].
BURSTEIN, E ;
PICUS, G ;
HENVIS, B ;
WALLIS, R .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1956, 1 (1-2) :65-74
[3]  
BURSTEIN E, 1956, J PHYS CHEM SOLIDS, V1, P75
[4]   SILICON DIVACANCY AND ITS DIRECT PRODUCTION BY ELECTRON IRRADIATION [J].
CORBETT, JW ;
WATKINS, GD .
PHYSICAL REVIEW LETTERS, 1961, 7 (08) :314-&
[5]   THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON [J].
SAH, CT ;
FORBES, L ;
ROSIER, LI ;
TASCH, AF ;
TOLE, AB .
APPLIED PHYSICS LETTERS, 1969, 15 (05) :145-+
[6]   BULK AND INTERFACE IMPERFECTIONS IN SEMICONDUCTORS [J].
SAH, CT .
SOLID-STATE ELECTRONICS, 1976, 19 (12) :975-990
[7]   CONCENTRATION PROFILES OF RECOMBINATION CENTERS IN SEMICONDUCTOR JUNCTIONS EVALUATED FROM CAPACITANCE TRANSIENTS [J].
SAH, CT ;
NEUGROSCHEL, A .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (09) :1069-1074
[8]   THERMALLY STIMULATED CAPACITANCE (TSCAP) IN P-N-JUNCTIONS [J].
SAH, CT ;
WALKER, JW ;
CHAN, WW ;
FU, HS .
APPLIED PHYSICS LETTERS, 1972, 20 (05) :193-&
[9]   THERMAL AND OPTICAL EMISSION AND CAPTURE RATES AND CROSS SECTIONS OF ELECTRONS AND HOLES AT IMPERFECTION CENTERS IN SEMICONDUCTORS FROM PHOTO AND DARK JUNCTION CURRENT AND CAPACITANCE EXPERIMENTS [J].
SAH, CT ;
FORBES, L ;
ROSIER, LL ;
TASCH, AF .
SOLID-STATE ELECTRONICS, 1970, 13 (06) :759-+
[10]   CURRENT AND CAPACITANCE TRANSIENT RESPONSES OF MOS CAPACITOR .2. RECOMBINATION CENTERS IN SURFACE SPACE-CHARGE LAYER [J].
SAH, CT ;
FU, HS .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 14 (01) :59-70