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PROPERTIES OF THIN LPCVD SILICON OXYNITRIDE FILMS
被引:23
作者
:
PAN, P
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, General Technology Div, Essex, Junction, VT, USA, IBM, General Technology Div, Essex Junction, VT, USA
PAN, P
ABERNATHEY, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, General Technology Div, Essex, Junction, VT, USA, IBM, General Technology Div, Essex Junction, VT, USA
ABERNATHEY, J
SCHAEFER, C
论文数:
0
引用数:
0
h-index:
0
机构:
IBM, General Technology Div, Essex, Junction, VT, USA, IBM, General Technology Div, Essex Junction, VT, USA
SCHAEFER, C
机构
:
[1]
IBM, General Technology Div, Essex, Junction, VT, USA, IBM, General Technology Div, Essex Junction, VT, USA
来源
:
JOURNAL OF ELECTRONIC MATERIALS
|
1985年
/ 14卷
/ 05期
关键词
:
D O I
:
10.1007/BF02654028
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
FILMS
引用
收藏
页码:617 / 632
页数:16
相关论文
共 19 条
[1]
PROPERTIES OF SIXOYNZ FILMS ON SI
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
BROWN, DM
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
GRAY, PV
HEUMANN, FK
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
HEUMANN, FK
PHILIPP, HR
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
PHILIPP, HR
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
TAFT, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
: 311
-
&
[2]
HIGH-CURRENT INJECTION INTO SIO2 FROM SI RICH SIO2-FILMS AND EXPERIMENTAL APPLICATIONS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2722
-
2735
[3]
DANGLING BONDS IN MEMORY-QUALITY SILICON-NITRIDE FILMS
论文数:
引用数:
h-index:
机构:
FUJITA, S
SASAKI, A
论文数:
0
引用数:
0
h-index:
0
机构:
Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
SASAKI, A
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(02)
: 398
-
402
[4]
PHYSICOCHEMICAL PROPERTIES OF CHEMICAL VAPOR-DEPOSITED SILICON OXYNITRIDE FROM A SIH4-CO2-NH3-H2 SYSTEM
GAIND, AK
论文数:
0
引用数:
0
h-index:
0
GAIND, AK
HEARN, EW
论文数:
0
引用数:
0
h-index:
0
HEARN, EW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
: 139
-
145
[5]
HYDROGEN CONTENT OF THERMALLY NITRIDED THIN SILICON DIOXIDE FILMS
HABRAKEN, FHPM
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
HABRAKEN, FHPM
EVERS, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
EVERS, EJ
KUIPER, AET
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
KUIPER, AET
[J].
APPLIED PHYSICS LETTERS,
1984,
44
(01)
: 62
-
64
[6]
CRYSTALLOGRAPHIC STUDY OF SEMI-INSULATING POLYCRYSTALLINE SILICON (SIPOS) DOPED WITH OXYGEN-ATOMS
HAMASAKI, M
论文数:
0
引用数:
0
h-index:
0
HAMASAKI, M
ADACHI, T
论文数:
0
引用数:
0
h-index:
0
ADACHI, T
WAKAYAMA, S
论文数:
0
引用数:
0
h-index:
0
WAKAYAMA, S
KIKUCHI, M
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(07)
: 3987
-
3992
[7]
PLASMA-ENHANCED THERMAL NITRIDATION OF SILICON
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
KATO, I
论文数:
0
引用数:
0
h-index:
0
KATO, I
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
NOZAKI, T
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
NAKAMURA, T
ISHIKAWA, H
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, H
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(05)
: 370
-
372
[8]
VERY THIN SILICON-NITRIDE FILMS GROWN BY DIRECT THERMAL-REACTION WITH NITROGEN
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
HIJIYA, S
论文数:
0
引用数:
0
h-index:
0
HIJIYA, S
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
NOZAKI, T
ARAKAWA, H
论文数:
0
引用数:
0
h-index:
0
ARAKAWA, H
SHINODA, M
论文数:
0
引用数:
0
h-index:
0
SHINODA, M
FUKUKAWA, Y
论文数:
0
引用数:
0
h-index:
0
FUKUKAWA, Y
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(03)
: 448
-
452
[9]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[10]
DEPOSITION AND COMPOSITION OF SILICON OXYNITRIDE FILMS
KUIPER, AET
论文数:
0
引用数:
0
h-index:
0
KUIPER, AET
KOO, SW
论文数:
0
引用数:
0
h-index:
0
KOO, SW
HABRAKEN, FHPM
论文数:
0
引用数:
0
h-index:
0
HABRAKEN, FHPM
TAMMINGA, Y
论文数:
0
引用数:
0
h-index:
0
TAMMINGA, Y
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1983,
1
(01):
: 62
-
66
←
1
2
→
共 19 条
[1]
PROPERTIES OF SIXOYNZ FILMS ON SI
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
BROWN, DM
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
GRAY, PV
HEUMANN, FK
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
HEUMANN, FK
PHILIPP, HR
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
PHILIPP, HR
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
机构:
General Electric Research and Development Center, Schenectady, New York
TAFT, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
: 311
-
&
[2]
HIGH-CURRENT INJECTION INTO SIO2 FROM SI RICH SIO2-FILMS AND EXPERIMENTAL APPLICATIONS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2722
-
2735
[3]
DANGLING BONDS IN MEMORY-QUALITY SILICON-NITRIDE FILMS
论文数:
引用数:
h-index:
机构:
FUJITA, S
SASAKI, A
论文数:
0
引用数:
0
h-index:
0
机构:
Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
SASAKI, A
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(02)
: 398
-
402
[4]
PHYSICOCHEMICAL PROPERTIES OF CHEMICAL VAPOR-DEPOSITED SILICON OXYNITRIDE FROM A SIH4-CO2-NH3-H2 SYSTEM
GAIND, AK
论文数:
0
引用数:
0
h-index:
0
GAIND, AK
HEARN, EW
论文数:
0
引用数:
0
h-index:
0
HEARN, EW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(01)
: 139
-
145
[5]
HYDROGEN CONTENT OF THERMALLY NITRIDED THIN SILICON DIOXIDE FILMS
HABRAKEN, FHPM
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
HABRAKEN, FHPM
EVERS, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
EVERS, EJ
KUIPER, AET
论文数:
0
引用数:
0
h-index:
0
机构:
STATE UNIV UTRECHT,RJVD GRAAFFLAB,3508 TA UTRECHT,NETHERLANDS
KUIPER, AET
[J].
APPLIED PHYSICS LETTERS,
1984,
44
(01)
: 62
-
64
[6]
CRYSTALLOGRAPHIC STUDY OF SEMI-INSULATING POLYCRYSTALLINE SILICON (SIPOS) DOPED WITH OXYGEN-ATOMS
HAMASAKI, M
论文数:
0
引用数:
0
h-index:
0
HAMASAKI, M
ADACHI, T
论文数:
0
引用数:
0
h-index:
0
ADACHI, T
WAKAYAMA, S
论文数:
0
引用数:
0
h-index:
0
WAKAYAMA, S
KIKUCHI, M
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(07)
: 3987
-
3992
[7]
PLASMA-ENHANCED THERMAL NITRIDATION OF SILICON
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
KATO, I
论文数:
0
引用数:
0
h-index:
0
KATO, I
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
NOZAKI, T
NAKAMURA, T
论文数:
0
引用数:
0
h-index:
0
NAKAMURA, T
ISHIKAWA, H
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, H
[J].
APPLIED PHYSICS LETTERS,
1981,
38
(05)
: 370
-
372
[8]
VERY THIN SILICON-NITRIDE FILMS GROWN BY DIRECT THERMAL-REACTION WITH NITROGEN
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
HIJIYA, S
论文数:
0
引用数:
0
h-index:
0
HIJIYA, S
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
NOZAKI, T
ARAKAWA, H
论文数:
0
引用数:
0
h-index:
0
ARAKAWA, H
SHINODA, M
论文数:
0
引用数:
0
h-index:
0
SHINODA, M
FUKUKAWA, Y
论文数:
0
引用数:
0
h-index:
0
FUKUKAWA, Y
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(03)
: 448
-
452
[9]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[10]
DEPOSITION AND COMPOSITION OF SILICON OXYNITRIDE FILMS
KUIPER, AET
论文数:
0
引用数:
0
h-index:
0
KUIPER, AET
KOO, SW
论文数:
0
引用数:
0
h-index:
0
KOO, SW
HABRAKEN, FHPM
论文数:
0
引用数:
0
h-index:
0
HABRAKEN, FHPM
TAMMINGA, Y
论文数:
0
引用数:
0
h-index:
0
TAMMINGA, Y
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1983,
1
(01):
: 62
-
66
←
1
2
→