INFLUENCE OF O2 AND OXIDE ON CL/SI SURFACE-REACTIONS

被引:5
作者
AOTO, N
IKAWA, E
KIKKAWA, T
KUROGI, Y
机构
[1] Microelectronics Research Laboratories, NEC Corporation, Sagamihara, Kanagawa, 229
关键词
D O I
10.1016/0039-6028(91)90191-T
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Variation of Si(111) and Si(100) surface conditions under sequential Cl2 exposure, O2 exposure, and other O-related treatments are examined by Auger electron spectroscopy (AES) and low-energy electron energy loss spectroscopy (LEELS). Cl-adsorbed Si surfaces, particularly Cl-adsorbed Si(111) surfaces, have a passivation effect under dry O2 atmosphere, where O adsorption and oxidation are suppressed. On the other hand, Cl desorption and oxidation take place immediately on Cl-adsorbed surfaces when exposed to wet environments: humid clean-room air or de-ionized water. When O2-treated Si surfaces are exposed to Cl2 atmospheres, Cl adsorption occurs on SiO(x) but not on SiO2.
引用
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页码:21 / 31
页数:11
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