共 39 条
- [1] THE APPLICATION OF LASER ANNEALING TO DOPANT PROFILING FOR SEMICONDUCTOR-DEVICES [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-5): : 433 - 437
- [3] PULSED ELECTRON-BEAM ANNEALING OF AS AND B IMPLANTED SILICON [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-5): : 209 - 214
- [4] EFFECT OF OXYGEN-PRESSURE ON OXYGEN INCORPORATION IN SI AND GA AS DURING Q-SWITCHED LASER IRRADIATION [J]. JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 229 - 234
- [6] NON-EQUILIBRIUM DOPANTS INCORPORATION IN SILICON MELTED BY LASER-PULSES [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 30 (04): : 195 - 211
- [8] CAREY PG, 1985, IEEE ELECT DEVICE LE, V6, P241
- [9] CAREY PR, IN PRESS
- [10] CHICAWA J, 1980, JAP J APPL PHYS, V19, pL577