INSTABILITY AND GATE VOLTAGE NOISE IN GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS

被引:9
作者
DAY, DJ [1 ]
TRUDEAU, M [1 ]
MCALISTER, SP [1 ]
HURD, CM [1 ]
机构
[1] NATL RES COUNCIL CANADA,DIV CHEM,OTTAWA K1A 0R9,ONTARIO,CANADA
关键词
D O I
10.1139/p89-042
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:238 / 241
页数:4
相关论文
共 16 条
[1]  
CANFIELD P, 1986, IEEE T ELECTRON DEV, V33, P923
[2]   LOW-FREQUENCY EMISSIONS FROM DEEP LEVELS IN GAAS-MESFETS [J].
DAS, MB ;
GHOSH, PK .
ELECTRONICS LETTERS, 1982, 18 (05) :207-208
[3]   NOISE VOLTAGE AND INSTABILITY IN GAAS DEVICES [J].
DAY, DJ ;
TRUDEAU, M ;
MCALISTER, SP ;
HURD, CM .
APPLIED PHYSICS LETTERS, 1988, 52 (24) :2034-2036
[4]  
DAY DJ, 1982, SOLID STATE ELECTRON, V25, P778
[5]   LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J].
DUTTA, P ;
HORN, PM .
REVIEWS OF MODERN PHYSICS, 1981, 53 (03) :497-516
[6]   LOW-FREQUENCY NOISE IN GALLIUM-ARSENIDE STRUCTURES [J].
HELLUMS, JR ;
RUCKER, LM .
SOLID-STATE ELECTRONICS, 1984, 27 (11) :949-952
[7]   GAAS-FETS WITH A FLICKER-NOISE CORNER BELOW 1 MHZ [J].
HUGHES, B ;
FERNANDEZ, NG ;
GLADSTONE, JM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (04) :733-741
[8]   CURRENT OSCILLATIONS IN SEMI-INSULATING GAAS ASSOCIATED WITH FIELD-ENHANCED CAPTURE OF ELECTRONS BY THE MAJOR DEEP DONOR EL2 [J].
KAMINSKA, M ;
PARSEY, JM ;
LAGOWSKI, J ;
GATOS, HC .
APPLIED PHYSICS LETTERS, 1982, 41 (10) :989-991
[9]   INFLUENCE OF TRAPPING, DIFFUSION AND RECOMBINATION ON CARRIER CONCENTRATION FLUCTUATIONS [J].
LAX, M ;
MENGERT, P .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 14 :248-267
[10]   EXPERIMENTAL EVALUATION OF LOW-FREQUENCY OSCILLATIONS IN UNDOPED GAAS TO PROBE DEEP LEVEL PARAMETERS [J].
MARACAS, GN ;
JOHNSON, DA ;
GORONKIN, H .
APPLIED PHYSICS LETTERS, 1985, 46 (03) :305-307