REFRACTIVE-INDEX OF (ALXGA1-X)(0.5)IN0.5P GROWN BY METALORGANIC VAPOR-PHASE EPITAXY

被引:50
作者
MOSER, M
WINTERHOFF, R
GENG, C
QUEISSER, I
SCHOLZ, F
DORNEN, A
机构
[1] 4. Physikalisches Institut, Universität Stuttgart, D-70550 Stuttgart
关键词
D O I
10.1063/1.111514
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ordered and disordered (AlxGa1-x)(0.5)In0.5P (x=O, 0.33, 0.66) layers have been grown on GaAs by metalorganic vapor phase epitaxy. The complex refractive index below and above the band edge has been determined by transmission experiments and ellipsometry. We have observed, that ordered and disordered samples only differ near the fundamental band gap with respect to these properties.
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页码:235 / 237
页数:3
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