ENHANCEMENT OF THE DEPOSITION RATE OF TIO2 FILM IN RADIO-FREQUENCY REACTIVE SPUTTERING

被引:24
作者
SEKIGUCHI, H
KANZAWA, A
IMAI, T
HONDA, T
机构
[1] TOPPAN PRINTING CO LTD,SUGITO,SAITAMA 345,JAPAN
[2] JAPAN ADV INST SCI & TECHNOL,HOKURIKU,TATSUNOKUCHI,ISHIKAWA 92312,JAPAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1994年 / 12卷 / 06期
关键词
D O I
10.1116/1.579234
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Titanium oxide thin films were prepared using rf reactive sputtering in which a titanium target was sputtered in a mixture of Ar and reactive O 2 gas. The flow modulation of reactive gas was proposed to enhance the deposition rate of the film which is generally low in continuous flow reactive sputtering. The experimental results indicated that the deposition rate could be enhanced maintaining the film stoichiometric ratio of TiO 2. The enhancement occurred because the modulated flow appeared to reduce the formation of compounds on the target surface which inhibit sputtering under continuous flow conditions. The effects of the flow modulation were understood by adapting a reactive sputtering theoretical model. © 1994, American Vacuum Society. All rights reserved.
引用
收藏
页码:3176 / 3179
页数:4
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