PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .2. INFLUENCE OF NON-EXPONENTIAL TRANSIENT ON DETERMINATION OF DEEP TRAP PARAMETERS

被引:25
作者
YOSHIE, O
KAMIHARA, M
机构
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1983年 / 22卷 / 04期
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D O I
10.1143/JJAP.22.629
中图分类号
O59 [应用物理学];
学科分类号
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页码:629 / 635
页数:7
相关论文
共 9 条
[1]   CURRENT TRANSIENT SPECTROSCOPY - A HIGH-SENSITIVITY DLTS SYSTEM [J].
BORSUK, JA ;
SWANSON, RM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (12) :2217-2225
[2]  
FAIRMAN RD, 1979, I PHYS C SER, V45, P134
[3]   HOW TO DETERMINE PARAMETERS OF DEEP LEVELS BY DLTS SINGLE TEMPERATURE SCANNING [J].
GOTO, H ;
ADACHI, Y ;
IKOMA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (10) :1979-1982
[4]   DEEP-LEVEL SPECTROSCOPY IN HIGH-RESISTIVITY MATERIALS [J].
HURTES, C ;
BOULOU, M ;
MITONNEAU, A ;
BOIS, D .
APPLIED PHYSICS LETTERS, 1978, 32 (12) :821-823
[5]   DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].
LANG, DV .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032
[6]   THERMAL AND OPTICAL EMISSION AND CAPTURE RATES AND CROSS SECTIONS OF ELECTRONS AND HOLES AT IMPERFECTION CENTERS IN SEMICONDUCTORS FROM PHOTO AND DARK JUNCTION CURRENT AND CAPACITANCE EXPERIMENTS [J].
SAH, CT ;
FORBES, L ;
ROSIER, LL ;
TASCH, AF .
SOLID-STATE ELECTRONICS, 1970, 13 (06) :759-+
[7]   DETERMINATION OF DEEP LEVELS IN CU-DOPED GAP USING TRANSIENT-CURRENT SPECTROSCOPY [J].
WESSELS, BW .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (03) :1131-1133
[8]   EFFECT OF NON-EXPONENTIAL TRANSIENTS ON THE DETERMINATION OF DEEP-TRAP ACTIVATION-ENERGIES BY DEEP-LEVEL TRANSIENT SPECTROSCOPY [J].
WHITE, AM ;
DAY, B ;
GRANT, AJ .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (22) :4833-4838
[9]   PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .1. COMPUTER-CONTROLLED MULTI-CHANNEL PICTS SYSTEM WITH HIGH-RESOLUTION [J].
YOSHIE, O ;
KAMIHARA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (04) :621-628