COMPARISON OF MODELS OF THE BUILT-IN ELECTRIC-FIELD IN SILICON AT HIGH DONOR DENSITIES

被引:7
作者
LOWNEY, JR
GEIST, JC
机构
关键词
D O I
10.1063/1.332910
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3624 / 3627
页数:4
相关论文
共 15 条
[1]   INFRARED ABSORPTION IN HEAVILY DOPED N-TYPE SI [J].
BALKANSKI, M ;
AZIZA, A ;
AMZALLAG, E .
PHYSICA STATUS SOLIDI, 1969, 31 (01) :323-+
[3]   EFFECT OF DONOR IMPURITIES ON THE DENSITY OF STATES NEAR THE BAND EDGE IN SILICON [J].
BENNETT, HS ;
LOWNEY, JR .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (09) :5633-5642
[5]   AUGER COEFFICIENTS FOR HIGHLY DOPED AND HIGHLY EXCITED SILICON [J].
DZIEWIOR, J ;
SCHMID, W .
APPLIED PHYSICS LETTERS, 1977, 31 (05) :346-348
[6]   EFFECT OF BAND-GAP NARROWING ON THE BUILT-IN ELECTRIC-FIELD IN N-TYPE SILICON [J].
GEIST, J ;
LOWNEY, JR .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (02) :1121-1123
[7]   SILICON PHOTO-DIODE FRONT REGION COLLECTION EFFICIENCY MODELS [J].
GEIST, J .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) :3993-3995
[8]   THOMAS-FERMI APPROACH TO IMPURE SEMICONDUCTOR BAND STRUCTURE [J].
KANE, EO .
PHYSICAL REVIEW, 1963, 131 (01) :79-&
[9]   DISAPPEARANCE OF IMPURITY LEVELS IN SILICON AND GERMANIUM DUE TO SCREENING [J].
LOWNEY, JR ;
KAHN, AH ;
BLUE, JL ;
WILSON, CL .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (06) :4075-4080
[10]   EFFECT OF DONOR IMPURITIES ON THE CONDUCTION AND VALENCE BANDS OF SILICON [J].
LOWNEY, JR ;
BENNETT, HS .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (01) :433-438