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A NOTE ON THE NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN FORMED METAL-INSULATOR-METAL DEVICES
被引:14
作者
:
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
[
1
]
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
[
1
]
机构
:
[1]
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
来源
:
THIN SOLID FILMS
|
1985年
/ 127卷
/ 1-2期
关键词
:
D O I
:
10.1016/0040-6090(85)90212-3
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:69 / 76
页数:8
相关论文
共 10 条
[1]
METAL-INSULATOR-METAL SANDWICH STRUCTURES WITH ANOMALOUS PROPERTIES
[J].
BIEDERMAN, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SUSSEX,SCH ENGN & APPL SCI,BRIGHTON BN1 9QT,SUSSEX,ENGLAND
UNIV SUSSEX,SCH ENGN & APPL SCI,BRIGHTON BN1 9QT,SUSSEX,ENGLAND
BIEDERMAN, H
.
VACUUM,
1976,
26
(12)
:513
-523
[2]
ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS
[J].
DEARNALEY, G
论文数:
0
引用数:
0
h-index:
0
DEARNALEY, G
;
STONEHAM, AM
论文数:
0
引用数:
0
h-index:
0
STONEHAM, AM
;
MORGAN, DV
论文数:
0
引用数:
0
h-index:
0
MORGAN, DV
.
REPORTS ON PROGRESS IN PHYSICS,
1970,
33
(11)
:1129
-+
[3]
Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[4]
THE EFFECTS OF FILAMENTARY CONDUCTION THROUGH UNIFORM AND FLAWED FILAMENTS IN INSULATORS AND SEMICONDUCTORS
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
GOULD, RD
.
JOURNAL OF NON-CRYSTALLINE SOLIDS,
1983,
55
(03)
:363
-386
[5]
RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, University of Science, Minden, Penang
GOULD, RD
.
THIN SOLID FILMS,
1979,
57
(01)
:33
-38
[6]
A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1984,
57
(01)
:1
-77
[7]
A MATHEMATICAL-ANALYSIS FOR THE PEAK OF THE CONDUCTION CHARACTERISTIC OF FORMED MIM DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(05)
:513
-516
[8]
THE EFFECT OF INSULATOR THICKNESS ON THE FORMING OF A MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1984,
3
(04)
:331
-332
[9]
THEORY FOR NEGATIVE RESISTANCE AND MEMORY EFFECTS IN THIN INSULATING FILMS AND ITS APPLICATION TO AU-ZNS-AU DEVICES
[J].
SUTHERLAND, RR
论文数:
0
引用数:
0
h-index:
0
SUTHERLAND, RR
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(03)
:468
-+
[10]
STRUCTURE AND ELECTRICAL-PROPERTIES OF THE ELECTROFORMED MIM STRUCTURE
[J].
THURSTANS, RE
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, Leicester Polytechnic, P.O. Box 143
THURSTANS, RE
.
THIN SOLID FILMS,
1979,
57
(01)
:153
-156
←
1
→
共 10 条
[1]
METAL-INSULATOR-METAL SANDWICH STRUCTURES WITH ANOMALOUS PROPERTIES
[J].
BIEDERMAN, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SUSSEX,SCH ENGN & APPL SCI,BRIGHTON BN1 9QT,SUSSEX,ENGLAND
UNIV SUSSEX,SCH ENGN & APPL SCI,BRIGHTON BN1 9QT,SUSSEX,ENGLAND
BIEDERMAN, H
.
VACUUM,
1976,
26
(12)
:513
-523
[2]
ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS
[J].
DEARNALEY, G
论文数:
0
引用数:
0
h-index:
0
DEARNALEY, G
;
STONEHAM, AM
论文数:
0
引用数:
0
h-index:
0
STONEHAM, AM
;
MORGAN, DV
论文数:
0
引用数:
0
h-index:
0
MORGAN, DV
.
REPORTS ON PROGRESS IN PHYSICS,
1970,
33
(11)
:1129
-+
[3]
Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[4]
THE EFFECTS OF FILAMENTARY CONDUCTION THROUGH UNIFORM AND FLAWED FILAMENTS IN INSULATORS AND SEMICONDUCTORS
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
GOULD, RD
.
JOURNAL OF NON-CRYSTALLINE SOLIDS,
1983,
55
(03)
:363
-386
[5]
RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, University of Science, Minden, Penang
GOULD, RD
.
THIN SOLID FILMS,
1979,
57
(01)
:33
-38
[6]
A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1984,
57
(01)
:1
-77
[7]
A MATHEMATICAL-ANALYSIS FOR THE PEAK OF THE CONDUCTION CHARACTERISTIC OF FORMED MIM DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(05)
:513
-516
[8]
THE EFFECT OF INSULATOR THICKNESS ON THE FORMING OF A MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1984,
3
(04)
:331
-332
[9]
THEORY FOR NEGATIVE RESISTANCE AND MEMORY EFFECTS IN THIN INSULATING FILMS AND ITS APPLICATION TO AU-ZNS-AU DEVICES
[J].
SUTHERLAND, RR
论文数:
0
引用数:
0
h-index:
0
SUTHERLAND, RR
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(03)
:468
-+
[10]
STRUCTURE AND ELECTRICAL-PROPERTIES OF THE ELECTROFORMED MIM STRUCTURE
[J].
THURSTANS, RE
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, Leicester Polytechnic, P.O. Box 143
THURSTANS, RE
.
THIN SOLID FILMS,
1979,
57
(01)
:153
-156
←
1
→