A NOTE ON THE NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN FORMED METAL-INSULATOR-METAL DEVICES

被引:14
作者
RAY, AK [1 ]
HOGARTH, CA [1 ]
机构
[1] BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
关键词
D O I
10.1016/0040-6090(85)90212-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:69 / 76
页数:8
相关论文
共 10 条
[1]   METAL-INSULATOR-METAL SANDWICH STRUCTURES WITH ANOMALOUS PROPERTIES [J].
BIEDERMAN, H .
VACUUM, 1976, 26 (12) :513-523
[2]   ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS [J].
DEARNALEY, G ;
STONEHAM, AM ;
MORGAN, DV .
REPORTS ON PROGRESS IN PHYSICS, 1970, 33 (11) :1129-+
[3]  
Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[5]   RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES [J].
GOULD, RD .
THIN SOLID FILMS, 1979, 57 (01) :33-38
[6]   A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR [J].
RAY, AK ;
HOGARTH, CA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1984, 57 (01) :1-77
[7]   A MATHEMATICAL-ANALYSIS FOR THE PEAK OF THE CONDUCTION CHARACTERISTIC OF FORMED MIM DEVICES [J].
RAY, AK ;
HOGARTH, CA .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1985, 4 (05) :513-516
[8]   THE EFFECT OF INSULATOR THICKNESS ON THE FORMING OF A MIM DEVICE [J].
RAY, AK ;
HOGARTH, CA .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1984, 3 (04) :331-332
[10]   STRUCTURE AND ELECTRICAL-PROPERTIES OF THE ELECTROFORMED MIM STRUCTURE [J].
THURSTANS, RE .
THIN SOLID FILMS, 1979, 57 (01) :153-156