共 17 条
- [2] BLANCHARD B, 1982, INT J MASS SPECTROM, V45, P35
- [3] APPLICATION OF IONIC MICROANALYSIS TO DETERMINATION OF BORON DEPTH PROFILES IN SILICON AND SILICA [J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01): : 85 - 94
- [4] CHARITAT G, 1982, THESIS INSA LYON