MEASUREMENT OF MINORITY-CARRIER DIFFUSION-COEFFICIENT IN SILICON BY AC PHOTO-CURRENT METHOD

被引：2

作者：

MOROHASHI, M

SAWAKI, N

SOMATANI, T

AKASAKI, I

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1983年 / 22卷 / 02期

关键词：

D O I：

10.1143/JJAP.22.276

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：276 / 280

页数：5

共 13 条

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