GATE-LENGTH DEPENDENCE OF DC AND MICROWAVE PROPERTIES OF SUBMICROMETER IN0.53GA0.47AS HIGFETS

被引:14
作者
FEUER, MD
TENNANT, DM
KUO, JM
SHUNK, SC
TELL, B
CHANG, TY
机构
关键词
D O I
10.1109/55.32432
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:70 / 72
页数:3
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