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SILICON OXIDATION STUDIES - SILICON ORIENTATION EFFECTS ON THERMAL-OXIDATION
被引:80
作者
:
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706
IRENE, EA
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706
MASSOUD, HZ
TIERNEY, E
论文数:
0
引用数:
0
h-index:
0
机构:
DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706
TIERNEY, E
机构
:
[1]
DUKE UNIV,DEPT ELECT ENGN,DURHAM,NC 27706
[2]
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1986年
/ 133卷
/ 06期
关键词
:
D O I
:
10.1149/1.2108829
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1253 / 1256
页数:4
相关论文
共 16 条
[1]
CALCULATED ELASTIC-CONSTANTS FOR STRESS PROBLEMS ASSOCIATED WITH SEMICONDUCTOR DEVICES
BRANTLEY, WA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS, MURRAY HILL, NJ 07974 USA
BELL LABS, MURRAY HILL, NJ 07974 USA
BRANTLEY, WA
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(01)
: 534
-
535
[2]
THEORY OF THE OXIDATION OF METALS
CABRERA, N
论文数:
0
引用数:
0
h-index:
0
CABRERA, N
MOTT, NF
论文数:
0
引用数:
0
h-index:
0
MOTT, NF
[J].
REPORTS ON PROGRESS IN PHYSICS,
1948,
12
: 163
-
184
[3]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[4]
OXIDATION OF SILICON - STRAIN AND LINEAR KINETICS
DOREMUS, RH
论文数:
0
引用数:
0
h-index:
0
机构:
Rensselaer Polytechnic Inst,, Materials Engineering Dep, Troy, NY,, USA, Rensselaer Polytechnic Inst, Materials Engineering Dep, Troy, NY, USA
DOREMUS, RH
[J].
THIN SOLID FILMS,
1984,
122
(03)
: 191
-
196
[5]
A REVISED ANALYSIS OF DRY OXIDATION OF SILICON
FARGEIX, A
论文数:
0
引用数:
0
h-index:
0
FARGEIX, A
GHIBAUDO, G
论文数:
0
引用数:
0
h-index:
0
GHIBAUDO, G
KAMARINOS, G
论文数:
0
引用数:
0
h-index:
0
KAMARINOS, G
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(05)
: 2878
-
2880
[6]
A VISCOUS-FLOW MODEL TO EXPLAIN THE APPEARANCE OF HIGH-DENSITY THERMAL SIO2 AT LOW OXIDATION TEMPERATURES
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IRENE, EA
TIERNEY, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TIERNEY, E
ANGILELLO, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ANGILELLO, J
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(11)
: 2594
-
2597
[7]
SILICON OXIDATION STUDIES - A REVISED MODEL FOR THERMAL-OXIDATION
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IRENE, EA
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(09)
: 5416
-
5420
[8]
EFFECT OF CRYSTAL ORIENTATION ON OXIDATION RATES OF SILICON IN HIGH PRESSURE STEAM
LIGENZA, JR
论文数:
0
引用数:
0
h-index:
0
LIGENZA, JR
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1961,
65
(11)
: 2011
-
&
[9]
THERMAL-OXIDATION OF SILICON IN DRY OXYGEN - ACCURATE DETERMINATION OF THE KINETIC RATE CONSTANTS
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
MASSOUD, HZ
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
PLUMMER, JD
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(07)
: 1745
-
1753
[10]
THERMAL-OXIDATION OF SILICON IN DRY OXYGEN - GROWTH-RATE ENHANCEMENT IN THE THIN REGIME .2. PHYSICAL-MECHANISMS
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
MASSOUD, HZ
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
PLUMMER, JD
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(11)
: 2693
-
2700
←
1
2
→
共 16 条
[1]
CALCULATED ELASTIC-CONSTANTS FOR STRESS PROBLEMS ASSOCIATED WITH SEMICONDUCTOR DEVICES
BRANTLEY, WA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS, MURRAY HILL, NJ 07974 USA
BELL LABS, MURRAY HILL, NJ 07974 USA
BRANTLEY, WA
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(01)
: 534
-
535
[2]
THEORY OF THE OXIDATION OF METALS
CABRERA, N
论文数:
0
引用数:
0
h-index:
0
CABRERA, N
MOTT, NF
论文数:
0
引用数:
0
h-index:
0
MOTT, NF
[J].
REPORTS ON PROGRESS IN PHYSICS,
1948,
12
: 163
-
184
[3]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[4]
OXIDATION OF SILICON - STRAIN AND LINEAR KINETICS
DOREMUS, RH
论文数:
0
引用数:
0
h-index:
0
机构:
Rensselaer Polytechnic Inst,, Materials Engineering Dep, Troy, NY,, USA, Rensselaer Polytechnic Inst, Materials Engineering Dep, Troy, NY, USA
DOREMUS, RH
[J].
THIN SOLID FILMS,
1984,
122
(03)
: 191
-
196
[5]
A REVISED ANALYSIS OF DRY OXIDATION OF SILICON
FARGEIX, A
论文数:
0
引用数:
0
h-index:
0
FARGEIX, A
GHIBAUDO, G
论文数:
0
引用数:
0
h-index:
0
GHIBAUDO, G
KAMARINOS, G
论文数:
0
引用数:
0
h-index:
0
KAMARINOS, G
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(05)
: 2878
-
2880
[6]
A VISCOUS-FLOW MODEL TO EXPLAIN THE APPEARANCE OF HIGH-DENSITY THERMAL SIO2 AT LOW OXIDATION TEMPERATURES
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IRENE, EA
TIERNEY, E
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TIERNEY, E
ANGILELLO, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ANGILELLO, J
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(11)
: 2594
-
2597
[7]
SILICON OXIDATION STUDIES - A REVISED MODEL FOR THERMAL-OXIDATION
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IRENE, EA
[J].
JOURNAL OF APPLIED PHYSICS,
1983,
54
(09)
: 5416
-
5420
[8]
EFFECT OF CRYSTAL ORIENTATION ON OXIDATION RATES OF SILICON IN HIGH PRESSURE STEAM
LIGENZA, JR
论文数:
0
引用数:
0
h-index:
0
LIGENZA, JR
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1961,
65
(11)
: 2011
-
&
[9]
THERMAL-OXIDATION OF SILICON IN DRY OXYGEN - ACCURATE DETERMINATION OF THE KINETIC RATE CONSTANTS
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
MASSOUD, HZ
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
PLUMMER, JD
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(07)
: 1745
-
1753
[10]
THERMAL-OXIDATION OF SILICON IN DRY OXYGEN - GROWTH-RATE ENHANCEMENT IN THE THIN REGIME .2. PHYSICAL-MECHANISMS
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
MASSOUD, HZ
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
PLUMMER, JD
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1985,
132
(11)
: 2693
-
2700
←
1
2
→