REACTIVE ION ETCHING OF TUNGSTEN FILMS SPUTTER DEPOSITED ON GAAS

被引:34
作者
ADACHI, S [1 ]
SUSA, N [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, MUSASHINO ELECT COMMUN LAB, MUSASHINO, TOKYO 180, JAPAN
关键词
D O I
10.1149/1.2113707
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:2980 / 2989
页数:10
相关论文
共 23 条
[1]   A NEW GATE STRUCTURE VERTICAL-GAAS FET [J].
ADACHI, S ;
ANDO, S ;
ASAI, H ;
SUSA, N .
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (06) :264-266
[2]  
BELL AT, 1978, SOLID STATE TECHNOL, V21, P89
[3]   THE PERMEABLE BASE TRANSISTOR AND ITS APPLICATION TO LOGIC-CIRCUITS [J].
BOZLER, CO ;
ALLEY, GD .
PROCEEDINGS OF THE IEEE, 1982, 70 (01) :46-52
[4]   FABRICATION AND NUMERICAL-SIMULATION OF THE PERMEABLE BASE TRANSISTOR [J].
BOZLER, CO ;
ALLEY, GD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (06) :1128-1141
[5]  
CLARK HA, 1976, SOLID STATE TECHNOL, V19, P51
[6]   OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) :3134-3136
[7]   PLASMA-ETCHING OF SI AND SIO2 IN SF6-O2 MIXTURES [J].
DAGOSTINO, R ;
FLAMM, DL .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) :162-167
[8]   SPECTROSCOPIC DIAGNOSTICS OF CF4-O2 PLASMAS DURING SI AND SIO2 ETCHING PROCESSES [J].
DAGOSTINO, R ;
CRAMAROSSA, F ;
DEBENEDICTIS, S ;
FERRARO, G .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) :1259-1265
[9]   COMPARISON OF LASER-INITIATED AND THERMAL CHEMICAL VAPOR-DEPOSITION OF TUNGSTEN FILMS [J].
DEUTSCH, TF ;
RATHMAN, DD .
APPLIED PHYSICS LETTERS, 1984, 45 (06) :623-625
[10]  
HESS DW, 1981, SOLID STATE TECHNOL, V24, P189