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ON THE RELATIONSHIP BETWEEN THE CONDUCTION CHARACTERISTICS AND THE STATISTICAL PARAMETERS OF A NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN AN ELECTROFORMED METAL-INSULATOR METAL DEVICE
被引:4
作者
:
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
[
1
]
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
[
1
]
机构
:
[1]
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
来源
:
THIN SOLID FILMS
|
1986年
/ 141卷
/ 02期
关键词
:
D O I
:
10.1016/0040-6090(86)90348-2
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:201 / 214
页数:14
相关论文
共 11 条
[1]
EFFECTS OF O-2 PRESSURE ON THE VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE AND ON THE ELECTRON-EMISSION OF CARBON THIN-FILM DEVICES WITH SILVER ELECTRODES
[J].
ARAKI, H
论文数:
0
引用数:
0
h-index:
0
机构:
Osaka Univ, Electron Beam Lab,, Osaka, Jpn, Osaka Univ, Electron Beam Lab, Osaka, Jpn
ARAKI, H
;
HANAWA, T
论文数:
0
引用数:
0
h-index:
0
机构:
Osaka Univ, Electron Beam Lab,, Osaka, Jpn, Osaka Univ, Electron Beam Lab, Osaka, Jpn
HANAWA, T
.
THIN SOLID FILMS,
1984,
121
(01)
:17
-27
[2]
ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS
[J].
DEARNALEY, G
论文数:
0
引用数:
0
h-index:
0
DEARNALEY, G
;
STONEHAM, AM
论文数:
0
引用数:
0
h-index:
0
STONEHAM, AM
;
MORGAN, DV
论文数:
0
引用数:
0
h-index:
0
MORGAN, DV
.
REPORTS ON PROGRESS IN PHYSICS,
1970,
33
(11)
:1129
-+
[3]
RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, University of Science, Minden, Penang
GOULD, RD
.
THIN SOLID FILMS,
1979,
57
(01)
:33
-38
[4]
GOULD RD, 1983, J NONCRYST SOLIDS, V55, P356
[5]
FURTHER STUDIES ON THIN-FILM STRUCTURES OF METAL BOROSILICATE GLASS-METAL
[J].
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
HOGARTH, CA
;
TAHERI, EHZ
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
TAHERI, EHZ
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1974,
37
(02)
:145
-156
[6]
A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1984,
57
(01)
:1
-77
[7]
A NOTE ON THE NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN FORMED METAL-INSULATOR-METAL DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
THIN SOLID FILMS,
1985,
127
(1-2)
:69
-76
[8]
ON THE EVALUATION OF STATISTICAL PARAMETERS OF A NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN A FORMED MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(12)
:1522
-1523
[9]
A MATHEMATICAL-ANALYSIS FOR THE PEAK OF THE CONDUCTION CHARACTERISTIC OF FORMED MIM DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(05)
:513
-516
[10]
THE EFFECT OF INSULATOR THICKNESS ON THE FORMING OF A MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1984,
3
(04)
:331
-332
←
1
2
→
共 11 条
[1]
EFFECTS OF O-2 PRESSURE ON THE VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE AND ON THE ELECTRON-EMISSION OF CARBON THIN-FILM DEVICES WITH SILVER ELECTRODES
[J].
ARAKI, H
论文数:
0
引用数:
0
h-index:
0
机构:
Osaka Univ, Electron Beam Lab,, Osaka, Jpn, Osaka Univ, Electron Beam Lab, Osaka, Jpn
ARAKI, H
;
HANAWA, T
论文数:
0
引用数:
0
h-index:
0
机构:
Osaka Univ, Electron Beam Lab,, Osaka, Jpn, Osaka Univ, Electron Beam Lab, Osaka, Jpn
HANAWA, T
.
THIN SOLID FILMS,
1984,
121
(01)
:17
-27
[2]
ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS
[J].
DEARNALEY, G
论文数:
0
引用数:
0
h-index:
0
DEARNALEY, G
;
STONEHAM, AM
论文数:
0
引用数:
0
h-index:
0
STONEHAM, AM
;
MORGAN, DV
论文数:
0
引用数:
0
h-index:
0
MORGAN, DV
.
REPORTS ON PROGRESS IN PHYSICS,
1970,
33
(11)
:1129
-+
[3]
RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES
[J].
GOULD, RD
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics, University of Science, Minden, Penang
GOULD, RD
.
THIN SOLID FILMS,
1979,
57
(01)
:33
-38
[4]
GOULD RD, 1983, J NONCRYST SOLIDS, V55, P356
[5]
FURTHER STUDIES ON THIN-FILM STRUCTURES OF METAL BOROSILICATE GLASS-METAL
[J].
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
HOGARTH, CA
;
TAHERI, EHZ
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
BRUNEL UNIV,PHYS DEPT,UXBRIDGE,MIDDLESEX,ENGLAND
TAHERI, EHZ
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1974,
37
(02)
:145
-156
[6]
A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
INTERNATIONAL JOURNAL OF ELECTRONICS,
1984,
57
(01)
:1
-77
[7]
A NOTE ON THE NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN FORMED METAL-INSULATOR-METAL DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
THIN SOLID FILMS,
1985,
127
(1-2)
:69
-76
[8]
ON THE EVALUATION OF STATISTICAL PARAMETERS OF A NORMAL-DISTRIBUTION OF FILAMENTARY RESISTANCES IN A FORMED MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(12)
:1522
-1523
[9]
A MATHEMATICAL-ANALYSIS FOR THE PEAK OF THE CONDUCTION CHARACTERISTIC OF FORMED MIM DEVICES
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1985,
4
(05)
:513
-516
[10]
THE EFFECT OF INSULATOR THICKNESS ON THE FORMING OF A MIM DEVICE
[J].
RAY, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
RAY, AK
;
HOGARTH, CA
论文数:
0
引用数:
0
h-index:
0
机构:
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
BRUNEL UNIV,DEPT PHYS,UXBRIDGE UB8 3PH,MIDDX,ENGLAND
HOGARTH, CA
.
JOURNAL OF MATERIALS SCIENCE LETTERS,
1984,
3
(04)
:331
-332
←
1
2
→