共 10 条
[1]
THE DEPENDENCE OF ALUMINUM NITRIDE FILM CRYSTALLOGRAPHY ON SPUTTERING PLASMA COMPOSITION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
1983, 1 (02)
:403-406
[4]
STRESS DEPENDENCE OF REACTIVELY SPUTTERED ALUMINUM NITRIDE THIN-FILMS ON SPUTTERING PARAMETERS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1989, 7 (03)
:2252-2255
[5]
THE INFLUENCE OF THE REACTIVE GAS-FLOW ON THE PROPERTIES OF ALN SPUTTER-DEPOSITED FILMS
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
1991, 140
:696-701
[6]
KOBAYASHI K, 1988, NUCL INSTRUM METH B, V33, P689