APPLICATION OF AN X-RAY STEPPER FOR SUBQUARTER MICROMETER FABRICATION

被引:7
作者
CHEN, Y
HAGHIRIGOSNET, AM
DECANINI, D
RAVET, MF
ROUSSEAUX, F
LAUNOIS, H
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 06期
关键词
D O I
10.1116/1.585922
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on a study of proximity x-ray lithography with a commercialized x-ray stepper (Karl Suss XRS200) and synchrotron orbital radiation at Super-ACO (Orsay, France). Special attention has been paid to the replication capabilities using SiC/W based high-resolution x-ray masks. The results show that proximity printing at a gap of 40 mum can result in subquarter micrometer replication. Since the resolution of the proximity printing is limited by the Fresnel diffraction, we use a double exposure technique to generate higher density and higher resolution grating structures. Fabrication of sub-100 nm linewidth gratings has been achieved using this technique with a wide exposure latitude.
引用
收藏
页码:3243 / 3247
页数:5
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