CHARACTERIZATION OF GAAS-O-GE AND ZNSE-O-GE HETEROINTERFACES GROWN ON OXYGEN-EXPOSED GAAS AND ZNSE SUBSTRATES

被引：3

作者：

JAIN, FC ^{[1
]}

机构：

[1] UNIV CONNECTICUT,INST MAT SCI,STORRS,CT 06268

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 03期

关键词：

D O I：

10.1116/1.582573

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：661 / 667

页数：7

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