INFLUENCE OF THE NON-EQUILIBRIUM VACANCIES ON THE DIFFUSION OF PHOSPHORUS INTO SILICON

被引:11
作者
MATHIOT, D
PFISTER, JC
机构
关键词
D O I
10.1063/1.331049
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3053 / 3058
页数:6
相关论文
共 11 条
[1]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) :1107-1118
[2]  
HILL C, 1981, 4TH P INT S SIL MAT
[3]   THEORETICAL CALCULATIONS OF FERMI LEVEL AND OF OTHER PARAMETERS IN PHOSPHORUS DOPED SILICON AT DIFFUSION TEMPERATURES [J].
JAIN, RK ;
VANOVERS.RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (02) :155-165
[4]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
KROGER, FA ;
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (06) :995-998
[5]   LONG-RANGE ENHANCEMENT OF BORON DIFFUSIVITY INDUCED BY A HIGH-SURFACE-CONCENTRATION PHOSPHORUS DIFFUSION [J].
LECROSNIER, D ;
GAUNEAU, M ;
PAUGAM, J ;
PELOUS, G ;
RICHOU, F .
APPLIED PHYSICS LETTERS, 1979, 34 (03) :224-226
[6]   ELECTRICAL PROPERTIES OF SILICON CONTAINING ARSENIC AND BORON [J].
MORIN, FJ ;
MAITA, JP .
PHYSICAL REVIEW, 1954, 96 (01) :28-35
[7]  
PEART RF, 1973, RAD DAMAGE DEFECTS S, P170
[8]   CHEMICAL DIFFUSION OF P IN SI [J].
SHAW, D .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 30 (02) :K139-K142
[9]   ENTHALPY OF VACANCY MIGRATION IN SI AND GE [J].
VANVECHTEN, JA .
PHYSICAL REVIEW B, 1974, 10 (04) :1482-1505
[10]   COMPARISON OF THEORY WITH QUENCHING EXPERIMENTS FOR ENTROPY AND ENTHALPY OF VACANCY FORMATION IN SI AND GE [J].
VANVECHTEN, JA ;
THURMOND, CD .
PHYSICAL REVIEW B, 1976, 14 (08) :3551-3557