INFLUENCE OF LATERAL CHARGE INHOMOGENEITIES IN MOS STRUCTURES ON THE DETERMINATION OF THE INTERFACE STATE DENSITY DISTRIBUTION FROM HF CV CURVES

被引：4

作者：

FENSKE, F

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 79卷 / 02期

关键词：

D O I：

10.1002/pssa.2210790212

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：417 / 421

页数：5

共 25 条

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[10]

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